In:
Applied Physics Letters, AIP Publishing, Vol. 100, No. 13 ( 2012-03-26)
Abstract:
The multi-frequency capacitance-voltage (C-V) spectroscopy is proposed for extracting the sub-bandgap density-of-states (DOS) of polymer semiconductors and demonstrated in three different thiophene-based organic thin-film transistors including poly(3-hexylthiophene), poly(3,3′′′-didodecylquaterthiophene), and poly(didodecylquaterthiophene-alt-didodecylbithiazole). The density of exponential tail and exponential deep states are extracted to be in the range of 3.0 × 1018 ∼ 1.5 × 1019 cm−3 eV−1 and 3.0 × 1016 ∼ 3.0 × 1017 cm−3 eV−1, respectively. The extracted DOS correspond to the polymer semiconductor-dependence of the measured crystallinity and mobility. In addition, the extracted DOS values are verified by comparing the measured I-V characteristics with the simulated results through a technology computer-aided design tool.
Type of Medium:
Online Resource
ISSN:
0003-6951
,
1077-3118
Language:
English
Publisher:
AIP Publishing
Publication Date:
2012
detail.hit.zdb_id:
211245-0
detail.hit.zdb_id:
1469436-0
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