In:
Japanese Journal of Applied Physics, IOP Publishing, Vol. 38, No. S1 ( 1999-01-01), p. 198-
Abstract:
It is known that the dielectric constant of SrTiO 3 thin film deposited on a thick substrate decreases with decreasing the thickness. This may be related with local atomic distortion in SrTiO 3 thin film. In order to detect the atomic distortion, Sr and Ti K-edge XAFS spectra were measured with a total-conversion electron/He ion-yield (CEY/CIY) apparatus which is easy to build and to operate. We confirmed the validity of our fabricated CEY/CIY apparatus and applied it to XAFS measurement of SrTiO 3 thin films. Fourier transforms of XAFS at different thicknesses suggested the local distortion induced by the internal stress in thin films.
Type of Medium:
Online Resource
ISSN:
0021-4922
,
1347-4065
DOI:
10.7567/JJAPS.38S1.198
Language:
Unknown
Publisher:
IOP Publishing
Publication Date:
1999
detail.hit.zdb_id:
218223-3
detail.hit.zdb_id:
797294-5
detail.hit.zdb_id:
2006801-3
detail.hit.zdb_id:
797295-7
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