In:
SID Symposium Digest of Technical Papers, Wiley, Vol. 41, No. 1 ( 2010-05), p. 1360-1362
Abstract:
This paper presents a new a‐Si:H gate driver circuit for large panel applications. Consisting of 12 TFTs and three capacitors, the proposed circuit is fabricated for measurement. The threshold voltage shift of TFTs is significantly reduced by reducing clock duty ratio. Experimental results indicate that the gate driver circuit operates stably under long‐term and high temperature testing.
Type of Medium:
Online Resource
ISSN:
0097-966X
,
2168-0159
Language:
English
Publisher:
Wiley
Publication Date:
2010
detail.hit.zdb_id:
2526337-7
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