In:
Japanese Journal of Applied Physics, IOP Publishing, Vol. 34, No. 1A ( 1995-01-01), p. L23-
Abstract:
The interfacial degradation of the insulator (SrTiO 3 , BaTiO 3 , PbTiO 3 , and BaO etc.)/YBa 2 Cu 3 O y heterostructures during excimer-laser deposition and subsequent annealing has been investigated. The secondary-ion mass spectroscopy (SIMS) measurement revealed, though very crudely, the mutual diffusion of constituent atoms. More precise data have been obtained quantitatively by measuring the change of the zero-resistance temperatures T c0 's (Kosterlitz-Thoules transition) of ultrathin YBa 2 Cu 3 O y before and after deposition of the insulating layers and annealing. The interfacial degradation developed with time t as t ∼0.4 , reflecting the thermal diffusion of constituents. The degradation also depended on the partnering insulating layer, i.e., it was minimized by BaTiO 3 and PbTiO 3 (lower-melting-point insulators).
Type of Medium:
Online Resource
ISSN:
0021-4922
,
1347-4065
Language:
Unknown
Publisher:
IOP Publishing
Publication Date:
1995
detail.hit.zdb_id:
218223-3
detail.hit.zdb_id:
797294-5
detail.hit.zdb_id:
2006801-3
detail.hit.zdb_id:
797295-7
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