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  • 1
    Online Resource
    Online Resource
    Trans Tech Publications, Ltd. ; 2015
    In:  Key Engineering Materials Vol. 645-646 ( 2015-5), p. 1072-1077
    In: Key Engineering Materials, Trans Tech Publications, Ltd., Vol. 645-646 ( 2015-5), p. 1072-1077
    Abstract: The elastic mechanical properties of silicon nanocantilevers are of prime importance in biotechnology and nanoelectromechanical system (NEMS) applications. In order to make these applications reliable, the exact evaluation of the effect of the undercut on the mechanical properties of silicon nanocantilevers is essential and critical. In this paper, a numerical-experimental method for determining the effect of the undercut on resonant frequencies and Young’s modulus of silicon nanocantilevers is proposed by combining finite element (FE) analysis and dynamic frequency response tests by using laser Doppler vibrometer (LDV) as well as static force-displacement curve test by using an atomic force microscope (AFM). Silicon nanocantilevers test structures are fabricated from silicon-on-insulator (SOI) wafers by using the standard complementary metal-oxide-semiconductor (CMOS) lithography process and anisotropic wet-etch release process based on the critical point drying, which inevitably generating the undercut of the nanocantilever clamping. Combining with three-dimensional FE numerical simulations incorporating the geometric undercut, the dynamic resonance tests demonstrate that the undercut obviously reduces resonant frequencies of nanocantilevers due to the fact that the undercut effectively increases the nanocantilever length by a correct value Δ L . According to a least-square fit expression including Δ L , we extract Young’s modulus from the measured resonance frequency versus the effective length dependency and find that Young’s modulus of a silicon nanocantilever with 200-nm thickness is close to that of bulk silicon. However, when we do not consider the undercut Δ L , the obtained Young's modulus is decreased 39.3%. Based on the linear force-displacement response of 12μm long and 200nm thick silicon nanocantilever obtained by using AFM, our extracted Young’s modulus of the [110] nanocantilever with and without undercut is 169.1GPa and 133.0GPa, respectively. This error reaches 21.3%. Our work reveals that the effect of the undercut on the characterization of the mechanical properties of nanocantilevers with dynamic and static test must be carefully considered.
    Type of Medium: Online Resource
    ISSN: 1662-9795
    URL: Issue
    Language: Unknown
    Publisher: Trans Tech Publications, Ltd.
    Publication Date: 2015
    detail.hit.zdb_id: 2073306-9
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  • 2
    In: Acta Physica Sinica, Acta Physica Sinica, Chinese Physical Society and Institute of Physics, Chinese Academy of Sciences, Vol. 70, No. 13 ( 2021), p. 139201-
    Abstract: In the summer of 2019, one case of electric field sounding in eyewall of No.1907 typhoon named Wipha was obtained in Wenchang, Hainan Island, China. Up to now, it has been the first case of electric field sounding results obtained in a typhoon system. In this paper, based on the observations of satellite, meteorological radar, ground electric field and cloud-to-ground flash location data of Hainan province, China, the basic characteristics of the typhoon are analyzed in detail. Owing to the limitation of cloud-to-ground flash location system, only flash activities of the typhoon before and after landing period are analyzed and the result does not show obvious features as reported by other researches. Referring to the radar reflectivity and sounding path, we confirm that the sounding penetrates through the eyewall region of the typhoon from cloud base to top. The electric field profile and the charge region distribution in the sounding path area are analyzed, and the results show that four positive and three negative charge regions exist between 5.74 and 9.10 km above sea level and the corresponding temperatures range from –2.4 to –16.7 ℃ of the seven charge regions. The mean charge densities of each charge region from bottom to top are 0.63 nC/m〈sup〉3〈/sup〉, –0.33 nC/m〈sup〉3〈/sup〉, 0.31 nC/m〈sup〉3〈/sup〉, –1.03 nC/m〈sup〉3〈/sup〉, 1.70 nC/m〈sup〉3〈/sup〉, 1.57 nC/m〈sup〉3〈/sup〉 and –1.20 nC/m〈sup〉3〈/sup〉, respectively. According to the preliminary analysis, we consider that the two positive charge layers at the top should be in the same charge region. Under the comprehensive consideration of the thickness of charge regions, the intensities of these six charge regions are 0.33 nC/m〈sup〉2〈/sup〉, –0.07 nC/m〈sup〉2〈/sup〉, 0.06 nC/m〈sup〉2〈/sup〉, –0.87 nC/m〈sup〉2〈/sup〉, 0.73 nC/m〈sup〉2〈/sup〉, and –0.18 nC/m〈sup〉2〈/sup〉, respectively. We can find that there are three dominant charge regions with largest intensity and they are the lowest positive charge region, the middle main negative region, and upper main positive charge region. And these vertical distributions of the three dominant charge regions are characterized by a tripole charge structure. These results are basically consistent with some simulation results. In addition, a negative screen charge region with a shallow depth in a range of 15–20 dBZ of the upper cloud boundary can be found. Combining the popular charging mechanisms, the similarity of tripole charge structure between our sounding and normal thunderstorm are discussed, and we preliminary consider that the non-inductive charging mechanism and the inductive charging mechanism, which originate from normal convection, are also suitable for eyewall region of typhoon.
    Type of Medium: Online Resource
    ISSN: 1000-3290 , 1000-3290
    Language: Unknown
    Publisher: Acta Physica Sinica, Chinese Physical Society and Institute of Physics, Chinese Academy of Sciences
    Publication Date: 2021
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  • 3
    Online Resource
    Online Resource
    Association for the Advancement of Artificial Intelligence (AAAI) ; 2018
    In:  Proceedings of the AAAI Conference on Artificial Intelligence Vol. 32, No. 1 ( 2018-04-27)
    In: Proceedings of the AAAI Conference on Artificial Intelligence, Association for the Advancement of Artificial Intelligence (AAAI), Vol. 32, No. 1 ( 2018-04-27)
    Abstract: Recently, hashing methods have been widely used in large-scale image retrieval. However, most existing supervised hashing methods do not consider the hierarchical relation of labels,which means that they ignored the rich semantic information stored in the hierarchy. Moreover, most of previous works treat each bit in a hash code equally, which does not meet the scenario of hierarchical labeled data. To tackle the aforementioned problems, in this paper, we propose a novel deep hashing method, called supervised hierarchical deep hashing (SHDH), to perform hash code learning for hierarchical labeled data. Specifically, we define a novel similarity formula for hierarchical labeled data by weighting each level, and design a deep neural network to obtain a hash code for each data point. Extensive experiments on two real-world public datasets show that the proposed method outperforms the state-of-the-art baselines in the image retrieval task.
    Type of Medium: Online Resource
    ISSN: 2374-3468 , 2159-5399
    Language: Unknown
    Publisher: Association for the Advancement of Artificial Intelligence (AAAI)
    Publication Date: 2018
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  • 4
    Online Resource
    Online Resource
    Elsevier BV ; 2022
    In:  Information Sciences Vol. 584 ( 2022-01), p. 170-183
    In: Information Sciences, Elsevier BV, Vol. 584 ( 2022-01), p. 170-183
    Type of Medium: Online Resource
    ISSN: 0020-0255
    RVK:
    Language: English
    Publisher: Elsevier BV
    Publication Date: 2022
    detail.hit.zdb_id: 218760-7
    detail.hit.zdb_id: 1478990-5
    SSG: 24,1
    SSG: 7,11
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  • 5
    Online Resource
    Online Resource
    Elsevier BV ; 2024
    In:  Pattern Recognition Vol. 145 ( 2024-01), p. 109911-
    In: Pattern Recognition, Elsevier BV, Vol. 145 ( 2024-01), p. 109911-
    Type of Medium: Online Resource
    ISSN: 0031-3203
    Language: English
    Publisher: Elsevier BV
    Publication Date: 2024
    detail.hit.zdb_id: 1466343-0
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  • 6
    Online Resource
    Online Resource
    Institute of Electrical and Electronics Engineers (IEEE) ; 2023
    In:  IEEE Transactions on Multimedia
    In: IEEE Transactions on Multimedia, Institute of Electrical and Electronics Engineers (IEEE)
    Type of Medium: Online Resource
    ISSN: 1520-9210 , 1941-0077
    RVK:
    Language: Unknown
    Publisher: Institute of Electrical and Electronics Engineers (IEEE)
    Publication Date: 2023
    detail.hit.zdb_id: 2033070-4
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  • 7
    Online Resource
    Online Resource
    Institute of Electrical and Electronics Engineers (IEEE) ; 2021
    In:  IEEE Transactions on Knowledge and Data Engineering
    In: IEEE Transactions on Knowledge and Data Engineering, Institute of Electrical and Electronics Engineers (IEEE)
    Type of Medium: Online Resource
    ISSN: 1041-4347 , 1558-2191 , 2326-3865
    RVK:
    Language: Unknown
    Publisher: Institute of Electrical and Electronics Engineers (IEEE)
    Publication Date: 2021
    detail.hit.zdb_id: 1001468-8
    detail.hit.zdb_id: 2026620-0
    SSG: 24,1
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  • 8
    Online Resource
    Online Resource
    Institute of Electrical and Electronics Engineers (IEEE) ; 2017
    In:  IEEE Transactions on Knowledge and Data Engineering Vol. 29, No. 2 ( 2017-2-1), p. 344-358
    In: IEEE Transactions on Knowledge and Data Engineering, Institute of Electrical and Electronics Engineers (IEEE), Vol. 29, No. 2 ( 2017-2-1), p. 344-358
    Type of Medium: Online Resource
    ISSN: 1041-4347
    RVK:
    Language: Unknown
    Publisher: Institute of Electrical and Electronics Engineers (IEEE)
    Publication Date: 2017
    detail.hit.zdb_id: 1001468-8
    detail.hit.zdb_id: 2026620-0
    SSG: 24,1
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  • 9
    Online Resource
    Online Resource
    Springer Science and Business Media LLC ; 2018
    In:  Data Mining and Knowledge Discovery Vol. 32, No. 4 ( 2018-7), p. 885-912
    In: Data Mining and Knowledge Discovery, Springer Science and Business Media LLC, Vol. 32, No. 4 ( 2018-7), p. 885-912
    Type of Medium: Online Resource
    ISSN: 1384-5810 , 1573-756X
    Language: English
    Publisher: Springer Science and Business Media LLC
    Publication Date: 2018
    detail.hit.zdb_id: 1386325-3
    detail.hit.zdb_id: 1479890-6
    SSG: 24,1
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  • 10
    Online Resource
    Online Resource
    Association for Computing Machinery (ACM) ; 2023
    In:  ACM Transactions on Information Systems Vol. 41, No. 1 ( 2023-01-31), p. 1-23
    In: ACM Transactions on Information Systems, Association for Computing Machinery (ACM), Vol. 41, No. 1 ( 2023-01-31), p. 1-23
    Abstract: Relation ties, defined as the correlation and mutual exclusion between different relations, are critical for distant supervised relation extraction. Previous studies usually obtain this property by greedily learning the local connections between relations. However, they are essentially limited because of failing to capture the global topology structure of relation ties and may easily fall into a locally optimal solution. To address this issue, we propose a novel force-directed graph to comprehensively learn relation ties. Specifically, we first construct a graph according to the global co-occurrence of all relations. Then, we borrow the idea of Coulomb’s law from physics and introduce the concept of attractive force and repulsive force into this graph to learn correlation and mutual exclusion between relations. Finally, the obtained relation representations are applied as an inter-dependent relation classifier. Extensive experimental results demonstrate that our method is capable of modeling global correlation and mutual exclusion between relations, and outperforms the state-of-the-art baselines. In addition, the proposed force-directed graph can be used as a module to augment existing relation extraction systems and improve their performance.
    Type of Medium: Online Resource
    ISSN: 1046-8188 , 1558-2868
    Language: English
    Publisher: Association for Computing Machinery (ACM)
    Publication Date: 2023
    detail.hit.zdb_id: 602352-6
    detail.hit.zdb_id: 2006337-4
    SSG: 24,1
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