In:
International Journal of Materials Research, Walter de Gruyter GmbH, Vol. 106, No. 1 ( 2015-01-09), p. 83-87
Abstract:
The Pb content effect of chemical solution deposited lanthanum-doped lead zirconate titanate (PLZT) (Pb:La:Zr:Ti = Pb:3:30:70, Pb = 105∼117) was studied for conductive aluminum-doped zinc oxide (AZO) and tin-doped indium oxide (ITO) deposited as top electrodes by means of pulsed laser deposition. The crystallinity, surface morphology, ferroelectric properties and hydrogen degradation resistance of the ITO/PLZT/Pt and AZO/PLZT/Pt capacitors were evaluated. All the PLZT films showed perovskite phase (revealed by X-ray diffraction patterns) and showed similar surface morphology and grain size (revealed by scanning electron microscopy images). PLZT capacitors with a Pb content of 113 exhibited the largest remnant polarization (at 15 V (300 kV cm − 1 )), however, the difference in hydrogen degradation resistance was small between the four levels of Pb content.
Type of Medium:
Online Resource
ISSN:
2195-8556
,
1862-5282
Language:
English
Publisher:
Walter de Gruyter GmbH
Publication Date:
2015
detail.hit.zdb_id:
2232675-3
detail.hit.zdb_id:
2128058-7
detail.hit.zdb_id:
203021-4
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