In:
Japanese Journal of Applied Physics, IOP Publishing, Vol. 25, No. 12R ( 1986-12-01), p. 1862-
Abstract:
Hg loss from the near-surface region of Hg 1- x Cd x Te with and without anodic oxide caps by a 60-min heat-treatment has been estimated for x ≃0.2 and x ≃0.3 from 40-MeV-O 5+ backscattering spectra. The Hg loss rate for various heat-treatment temperatures T was compared with the T -dependence of the Hg content of the oxide films. For x ≃0.2, the Hg loss of a sample with 1000 Å oxide film exceeded 1×10 17 Hg/cm 2 at T 〉 300°C, while that of the uncapped sample reached the same level around T =250°C. For x ≃0.3, the Hg loss was not appreciable up to 320°C, even for an uncapped sample; however, it exceeded 1×10 17 Hg/cm 2 around T =340°C, even for a capped sample. Furthermore, the Hg content of anodic oxide films rapidly decreased in the temperature range 250∼290°C for both x ≃0.2 and x ≃0.3. These behaviours suggest that protective effect of the oxide cap against Hg loss decreases with decreasing Hg-content of the films.
Type of Medium:
Online Resource
ISSN:
0021-4922
,
1347-4065
DOI:
10.1143/JJAP.25.1862
Language:
Unknown
Publisher:
IOP Publishing
Publication Date:
1986
detail.hit.zdb_id:
218223-3
detail.hit.zdb_id:
797294-5
detail.hit.zdb_id:
2006801-3
detail.hit.zdb_id:
797295-7
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