In:
IEEE Design & Test of Computers, Institute of Electrical and Electronics Engineers (IEEE), Vol. 19, No. 6 ( 2002-11), p. 52-63
Type of Medium:
Online Resource
ISSN:
0740-7475
DOI:
10.1109/MDT.2002.1047744
RVK:
SQ 11004244 s#!103822215X!
Language:
Unknown
Publisher:
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date:
2002
detail.hit.zdb_id:
605391-9
detail.hit.zdb_id:
2028644-2
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