In:
Advances in X-ray Analysis, Cambridge University Press (CUP), Vol. 2 ( 1958), p. 333-339
Abstract:
Minor amounts of rare-earth elements (0.01 to 1.0%) in high-purity rare-earth oxides may be determined by a fluorescent X-ray procedure. The analysis of high-purity yttrium, cerium, praseodymium, neodymium, and samarium is described. Basic to the method is accurate determination of spectral line intensity above background. Sample and standard preparation, choice of analytical lines, and utilization of a helium path to increase X-ray intensities are discussed. Precision and accuracy were evaluated by analyzing samples of known composition. The average of five separate determinations showed an average error of about 10 per cent.
Type of Medium:
Online Resource
ISSN:
0376-0308
,
2631-3626
DOI:
10.1154/S037603080000063X
Language:
English
Publisher:
Cambridge University Press (CUP)
Publication Date:
1958
detail.hit.zdb_id:
2498440-1
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