GLORIA

GEOMAR Library Ocean Research Information Access

Your email was sent successfully. Check your inbox.

An error occurred while sending the email. Please try again.

Proceed reservation?

Export
Filter
  • Chemistry/Pharmacy  (4)
Material
Language
Years
Subjects(RVK)
RVK
  • 1
    In: Inorganica Chimica Acta, Elsevier BV, Vol. 243, No. 1-2 ( 1996-2), p. 39-45
    Type of Medium: Online Resource
    ISSN: 0020-1693
    RVK:
    Language: English
    Publisher: Elsevier BV
    Publication Date: 1996
    detail.hit.zdb_id: 1484441-2
    detail.hit.zdb_id: 210318-7
    Location Call Number Limitation Availability
    BibTip Others were also interested in ...
  • 2
    Online Resource
    Online Resource
    Cambridge University Press (CUP) ; 1974
    In:  Advances in X-ray Analysis Vol. 18 ( 1974), p. 309-316
    In: Advances in X-ray Analysis, Cambridge University Press (CUP), Vol. 18 ( 1974), p. 309-316
    Abstract: An X-ray fluorescence analysis unit has been automated with a multi-position sample changer, a stepping motor to position the spectrometer, and computer addressable switches to control the selection of crystal, detector, collimator, and beam filter. The unit can be controlled off-line through a Teletype or on-line with a computer. This computer utilizes a multi-user program for the simultaneous operation of the fluorescence analysis unit and two diffractometers. Programming the system for any desired analytical or research procedure is accomplished using an expanded version of BASIC.
    Type of Medium: Online Resource
    ISSN: 0376-0308 , 2631-3626
    RVK:
    RVK:
    RVK:
    Language: English
    Publisher: Cambridge University Press (CUP)
    Publication Date: 1974
    detail.hit.zdb_id: 2498440-1
    Location Call Number Limitation Availability
    BibTip Others were also interested in ...
  • 3
    Online Resource
    Online Resource
    Cambridge University Press (CUP) ; 1972
    In:  Advances in X-ray Analysis Vol. 16 ( 1972), p. 379-389
    In: Advances in X-ray Analysis, Cambridge University Press (CUP), Vol. 16 ( 1972), p. 379-389
    Abstract: The angular dependent factors which affect the intensities of X-ray diffraction line profiles, as observed on a Standard X-ray diffractometer, are well established. They are the Lorentz factor, the polarization factor, the atomic scattering factor, and the temperature factor. For residual stress analysis, in which measurements are made at non-zero omega (psi) angles, an absorption factor must be added to this list. It is usual, however, in residual stress analysis, to omit two of these factors: the atomic scattering factor and the temperature factor. The omission of these two factors appreciably alters the change in the combined correction factor with change of diffraction angle. The proper angular dependent corrections are in the opposite sense to those customarily employed. The effect of the additional factors on measurements of residual stress are discussed.
    Type of Medium: Online Resource
    ISSN: 0376-0308 , 2631-3626
    RVK:
    RVK:
    RVK:
    Language: English
    Publisher: Cambridge University Press (CUP)
    Publication Date: 1972
    detail.hit.zdb_id: 2498440-1
    Location Call Number Limitation Availability
    BibTip Others were also interested in ...
  • 4
    Online Resource
    Online Resource
    Cambridge University Press (CUP) ; 1971
    In:  Advances in X-ray Analysis Vol. 15 ( 1971), p. 102-113
    In: Advances in X-ray Analysis, Cambridge University Press (CUP), Vol. 15 ( 1971), p. 102-113
    Abstract: The instrumentation and software for performing X-ray intensity measurements with a paper tape controlled diffractometer are described. The hardware includes two addressable axis positioners which control Slo-Syn stepping motors on the 2θ and ω) axes of the diffractometer, an addressable scaler-timer, a multiaxis programmer and a Teletype, in addition to the normal counting electronics. This system may be manually controlled with front panel switches or with instructions entered on the Teletype. In the automatic off-line mode instructions for motor speed, motor direction, starting angle, final angle, angular increment and scaler preset (time or counts) punched on paper tape are read and executed in sequence. A Teletype output of 2θ and ω angles, time and counts is obtained at each step. This off-line system was used for the measurement of austenite in H12 hot work die steel austenitized at various conditions and which contained a maximum of 13% austenite. A helium chamber was used to extend the limit of detection to 0.4% austenite. The X-ray analysis involved measuring the areas of the (200) austenite diffraction line and the (200) martensite line. For each of these lines, the system was programmed to integrate the counts over angular intervals corresponding to a low-angle background, the peak and a high-angle background using the ability of the axis positioner to stop the scaler-timer at the end of each angular interval. The additional capability of slewing rapidly between the various diffraction lines reduced the time required for automatic data collection. The present off-line system can be used to simplify other types of X-ray diffraction analysis such as residual stress and microstrain/particle size determinations, since the manual data handling can be eliminated with the computer compatible punched paper tape output. Future development of this instrumentation includes direct computer control of the diffractometer and computerized data reduction, with the advantage of a paper tape back-up system.
    Type of Medium: Online Resource
    ISSN: 0376-0308 , 2631-3626
    RVK:
    RVK:
    RVK:
    Language: English
    Publisher: Cambridge University Press (CUP)
    Publication Date: 1971
    detail.hit.zdb_id: 2498440-1
    Location Call Number Limitation Availability
    BibTip Others were also interested in ...
Close ⊗
This website uses cookies and the analysis tool Matomo. More information can be found here...