In:
Journal of Materials Research, Springer Science and Business Media LLC, Vol. 16, No. 3 ( 2001-03), p. 778-783
Abstract:
Ba 0.8 Sr 0.2 TiO 3 films were fabricated with a 0.05 M solution by a sol-gel process at temperatures between 550 and 650 °C. Analysis by x-ray diffraction, Raman spectroscopy, and scanning electron microscopy revealed that the films annealed at 650 °C showed pure perovskite phase, tetragonal structure, and columnar grains with an average grain size of 150 nm. Electrical measurements performed on the films annealed at 650 °C showed two dielectric peaks in the dielectric constant–temperature curve, a remnant polarization of 1.4 μC/cm 2 , a coercive field of 18.3 kV/cm, and good insulating property. The measured pyroelectric coefficient for the films annealed at 650 °C was larger than 3.1 × 10 −4 C/m 2 K at the temperatures ranging from 10 to 26 °C and reached the maximum value of 4.1 × 10 −4 C/m 2 K at 16 °C. The excellent pyroelectric property rendered the Ba 0.8 Sr 0.2 TiO 3 films annealed at 650 °C promising for uncooled infrared detectors and thermal imaging applications.
Type of Medium:
Online Resource
ISSN:
0884-2914
,
2044-5326
DOI:
10.1557/JMR.2001.0099
Language:
English
Publisher:
Springer Science and Business Media LLC
Publication Date:
2001
detail.hit.zdb_id:
54876-5
detail.hit.zdb_id:
2015297-8
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