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  • 1
    Electronic Resource
    Electronic Resource
    Springer
    International journal of thermophysics 21 (2000), S. 525-534 
    ISSN: 1572-9567
    Keywords: ac calorimetric method ; thermal diffusivity ; thin film ; two-dimensional effect
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract An ac calorimetric method for measuring the thermal diffusivity of thin-film materials has been widely applied. In the application of this method, the systematic errors caused by the heat loss effect, the edge reflection effect, etc., have been analyzed and corresponding correction methods have been developed. But when measuring films with low thermal diffusivity or with thickness comparable to the thermal diffusion length, a two-dimensional effect which will also result in a systematic error of the measurement is present. In this paper, the mechanism of two-dimensional heat conduction within a thin sample which is supplied a periodic heat flux by a chopped light beam is analyzed. A numerical analysis method is developed to study the effect of the two-dimensional heat conduction on the measured thermal diffusivity values. The relations between the measured thermal diffusivity and independent parameters such as frequency, thickness of sample, width of light spot, etc., are demonstrated to indicate the two-dimensional effect. The experimental precondition for minimizing the systematic error caused by the two-dimensional effect is determined. In addition, the analysis method presented in this paper should be useful for more difficult problems such as error estimation of the thermal diffusivity measurement of coatings or composite films.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Springer
    International journal of thermophysics 21 (2000), S. 487-493 
    ISSN: 1572-9567
    Keywords: ac calorimetric method ; CVD diamond film ; edge effect ; parameter estimation ; thermal diffusivity
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract In the thermal diffusivity measurement of a CVD diamond film using an ac calorimetric method, the reflection of an ac temperature wave at the edge of the film sample should be considered due to the limited length of the sample and its high thermal diffusivity, i.e., the edge effect. In this case, the measured thermal diffusivity is given as a function of frequency. The relation between the measured thermal diffusivity and the frequency is represented as an analytical expression. The real thermal diffusivity is obtained by correcting the edge effect by two means. One is an iterative method using the directly measured edge length of the sample to fit the analytical expression. The other is a parameter estimation method by which a simplex method is used to estimate the edge length and the real thermal diffusivity. Thermal diffusivities of two diamond films were measured, and data were analyzed using the above methods. The result shows that the parameter estimation method is relatively accurate and convenient in processing test data.
    Type of Medium: Electronic Resource
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