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  • PACS: 61.16.Ch; 62.20.-x; 68.35.Bs  (1)
  • Polymer and Materials Science  (1)
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  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Applied physics 61 (1995), S. 525-533 
    ISSN: 1432-0630
    Keywords: PACS: 61.16.Ch; 62.20.-x; 68.35.Bs
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract.  The frictional properties of freshly cleaved (010) surfaces of the ferroelectric TriGlycine Sulfate (TGS) were investigated by combined scanning and friction force microscopy under ambient conditions. A frictional contrast could be observed between domains with different electrical polarity, as well as between terraces inside individual domains which are separated by steps of half of the unit-cell height or an odd multiple of this value. The latter contrast mechanism originates from the arrangement of the molecules at the surface which is chemically homogeneous, but structurally rotated by 180° between different terraces. The resulting asymmetric surface potential gives rise to a frictional anisotropy in different directions that can be detected by the force microscope, as well as to a change of the frictional force between forward and backward scan direction.
    Type of Medium: Electronic Resource
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  • 2
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The calculation of Miller indices from out-of-plane angle measurements with scanning force microscopy (SFM) is demonstrated on three different systems: rutile on haematite, rutile on sapphire and haematite on sapphire. The height of the investigated crystallites ranges from several millimetres (rutile on haematite) down to 〈10 nm (haematite on sapphire). General issues of goniometry by means of SFM, such as the influence of the scanner calibration, the adjustment of the feedback loop on the error involved in out-of-plane angle measurements and the limitation of SFM goniometry due to tip geometry, are discussed and a comparison with other methods are given.
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
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