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  • 1
    ISSN: 1432-0533
    Keywords: Key words Hypothermia ; Spinal cord trauma ; Albumin ; Fibrinogen ; Fibronectin
    Source: Springer Online Journal Archives 1860-2000
    Topics: Medicine
    Notes: Abstract Systemic hypothermia has neuroprotective effects in experimental models of central nervous system ischemia caused by vascular occlusions. The present study addresses the question as to whether systemic hypothermia can influence the extravasation of plasma proteins following severe spinal cord compression trauma using immunohistochemistry to identify the plasma proteins albumin, fibrinogen and fibronectin. Fifteen rats were assigned to one of three groups and received either thoracic (T) laminectomy or severe spinal cord compression trauma of the T8–9 segment. One group comprised laminectomized animals without compression trauma submitted to a hypothermic procedure in which the core temperature was reduced from 38° to 30 °C. The two trauma groups were either submitted to the same hypothermic procedure or kept normothermic during the corresponding time. All animals were killed 24 h following the surgical procedure. The normothermic and hypothermic trauma groups had indications of marked extravasation of albumin, fibrinogen and fibronectin at the site of the injury (T8–9). There was also pronounced extravasation in the cranial and caudal peri-injury zones (T7 and T10) of normothermic injured rats but, with few exceptions, not in the hypothermic ones with the same degree of compression. By measuring the cross-sectional area of the peri-injury zones we found in the hypothermic trauma group a significant reduction of the expansion compared with that present in normothermic injured rats. Our study thus indicates that hypothermia reduces the extravasation of the plasma proteins albumin, fibrinogen and fibronectin following spinal cord compression in the rat. Such a reduction may contribute to neuroprotective effects exerted by hypothermia.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Hoboken, NJ : Wiley-Blackwell
    AIChE Journal 13 (1967), S. 1127-1131 
    ISSN: 0001-1541
    Keywords: Chemistry ; Chemical Engineering
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Process Engineering, Biotechnology, Nutrition Technology
    Notes: The purpose of this study was to determine the two-dimensional temperature field for a fluid in slug flow through tubes with uniform mass injection and linearly decreasing wall temperature. A series solution was obtained, the first ten eigenvalues for which were determined from the characteristic equation by the method of Runge-Kutta. Expressions for local conductive heat flux at the tube wall and local Nusselt number were obtained as a function of inlet Peclet number, injection Peclet number, tube radius, temperature boundary conditions, and fluid properties. Sample results are presented for several injection rates at different wall temperature conditions. In general, mass injection was found to decrease the local heat flux and increase temperature driving force causing a decrease in the Nusselt number.
    Additional Material: 6 Ill.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 22 (1994), S. 515-519 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The effects of chemical etching and noble gas ion bombardment on GaAs(100) surfaces were investigated by angular resolved x-ray photoelectron spectroscopy (ARXPS) and low energy ion scattering spectroscopy (LEISS). The results show that at the As received GaAs surface, Ga oxide is the major component, resulting in a Ga concentration slightly higher than As. Chemical cleaning by hydrochloride acid (HCl(conc.) to H2O=1:1) followed by solvent washing efficiently removed the oxide layer, but ARXPS showed a strong As enrichment occurs at the cleaned GaAs surface. Ion bombardment was carried out using 3 keV Ar ions with a beam current of 1 mA for 50 min. XPS results show that at steady state the ion-bombarded GaAs surface is depleted in As (As/Ga ∼ 0.8), but ARXPS indicates an As increase at the very surface. This is further confirmed by Ne+ LEISS analysis, which shows the top layer As concentration is increased by 40% after ion bombardment. The results indicate that bombardment-induced compositional changes are due to Gibbsian segregation.
    Additional Material: 4 Ill.
    Type of Medium: Electronic Resource
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