Schlagwort(e):
Inductively coupled plasma mass spectrometry.
;
Electronic books.
Beschreibung / Inhaltsverzeichnis:
Written by one of the very first practitioners of ICP-MS, a Practical Guide to ICP-MS and Other AS Techniques: A Tutorial for Beginners presents ICP-MS in a completely novel and refreshing way.
Materialart:
Online-Ressource
Seiten:
1 online resource (461 pages)
Ausgabe:
4th ed.
ISBN:
9781000915471
Serie:
Practical Spectroscopy Series
URL:
https://ebookcentral.proquest.com/lib/geomar/detail.action?docID=30746031
DDC:
543.65
Sprache:
Englisch
Anmerkung:
Cover -- Half Title -- Series -- Title -- Copyright -- Contents -- Foreword -- Preface -- Acknowledgments -- About the Author -- Chapter 1 An Overview of ICP Mass Spectrometry -- 1.1 Principles of Operation -- Chapter 2 Principles of Ion Formation -- 2.1 Ion Formation -- 2.2 Natural Isotopes -- Chapter 3 Sample Introduction -- 3.1 Aerosol Generation -- 3.2 Droplet Selection -- 3.3 Nebulizers -- 3.4 Concentric Design -- 3.5 Cross-Flow Design -- 3.6 Microflow Design -- 3.7 Spray Chambers -- 3.8 Double-Pass Spray Chamber -- 3.9 Cyclonic Spray Chamber -- 3.10 Aerosol Dilution -- 3.11 Final Thoughts -- Chapter 4 Plasma Source -- 4.1 The Plasma Torch -- 4.2 Formation of an ICP Discharge -- 4.3 The Function of the RF Generator -- 4.4 Ionization of the Sample -- Chapter 5 Interface Region -- 5.1 Capacitive Coupling -- 5.2 Ion Kinetic Energy -- 5.3 Benefits of a Well-Designed Interface -- 5.4 Final Thoughts -- Chapter 6 Ion-Focusing System -- 6.1 Role of the Ion Optics -- 6.2 Dynamics of Ion Flow -- 6.3 Commercial Ion Optic Designs -- Chapter 7 Mass Analyzers: Quadrupole Technology -- 7.1 Basic Principles of Operation -- 7.2 Quadrupole Performance Criteria -- 7.3 Resolution -- 7.4 Abundance Sensitivity -- 7.5 Benefit of Good Abundance Sensitivity -- Chapter 8 Mass Analyzers: Double-Focusing Magnetic Sector Technology -- 8.1 Magnetic-Sector Mass Spectroscopy: A Historical Perspective -- 8.2 Use of Magnetic-Sector Technology for ICP-MS -- 8.3 Principles of Operation of Magnetic-Sector Technology -- 8.4 Resolving Power -- 8.5 Other Benefits of Magnetic-Sector Instrumentation -- 8.6 Simultaneous-Measurement Approach Using One Detector -- 8.7 Final Thoughts -- Chapter 9 Mass Analyzers: Time-of-Flight Technology -- 9.1 Basic Principles of TOF Technology -- 9.2 Commercial Designs -- 9.3 Differences between Orthogonal and On-Axis TOF.
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9.4 Benefits of TOF Technology for ICP-MS -- 9.5 Rapid Transient Peak Analysis -- 9.6 Improved Precision -- 9.7 Rapid Data Acquisition -- 9.8 High-Speed Multi-Elemental Imaging Using Laser Ablation Coupled with TOF-ICP-MS -- 9.9 Laser Ablation Laser Ionization Time-of-Flight Mass Spectrometry -- 9.10 Final Thoughts -- Chapter 10 Mass Analyzers: Collision/Reaction Cell and Interface Technology -- 10.1 Basic Principles of Collision/Reaction Cells -- 10.2 Different Collision/Reaction Cell Approaches -- 10.3 Collisional Mechanisms Using Nonreactive Gases and Kinetic Energy Discrimination -- 10.4 Reaction Mechanisms with Highly Reactive Gases and Discrimination by Selective Bandpass Mass Filtering -- 10.5 Dynamic Reaction Cell -- 10.6 Low-Mass Cutoff Collision/Reaction Cell -- 10.7 Using Reaction Mechanisms in a Collision Cell -- 10.8 The Universal Cell -- 10.9 The Collision/Reaction Interface -- 10.10 Detection Limit Comparison of Single-Quadrupole CRC Systems -- 10.11 Triple-Quadrupole Systems -- 10.12 M/S Mode -- 10.13 MS/MS Mode -- 10.14 On-Mass MS/MS Mode -- 10.15 Mass-Shift MS/MS Mode -- 10.16 Multi-Quad Systems -- 10.17 Difference Between a Triple and Multi Quad System -- 10.18 Final Thoughts -- Chapter 11 Ion Detectors -- 11.1 Channel Electron Multiplier -- 11.2 Faraday Cup -- 11.3 Discrete-Dynode Electron Multiplier -- 11.4 Extending the Dynamic Range -- 11.5 Filtering the Ion Beam -- 11.6 Using Two Detectors -- 11.7 Using Two Scans with One Detector -- 11.8 Using One Scan with One Detector -- 11.9 Extending the Dynamic Range Using Pulse-Only Mode -- 11.10 Simultaneous Array Detectors -- Chapter 12 Peak Measurement Protocol -- 12.1 Measurement Variables -- 12.2 Measurement Protocol -- 12.3 Optimization of Measurement Protocol -- 12.4 Multielement Data Quality Objectives -- 12.5 Data Quality Objectives for Single-Particle ICP-MS Studies.
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12.6 Final Thoughts -- Chapter 13 Methods of Quantitation -- 13.1 Quantitative Analysis -- 13.2 External Standardization -- 13.3 Standard Additions -- 13.4 Addition Calibration -- 13.5 Semiquantitative Analysis -- 13.6 Isotope Dilution -- 13.7 Isotope Ratios -- 13.8 Internal Standardization -- Chapter 14 Review of ICP-MS Interferences -- 14.1 Spectral Interferences -- 14.2 Oxides, Hydroxides, Hydrides and Doubly Charged Species -- 14.3 Isobaric Interferences -- 14.4 Ways to Compensate for Spectral Interferences -- 14.5 Mathematical Correction Equations -- 14.6 Cool/Cold Plasma Technology -- 14.7 Collision/Reaction Cells -- 14.8 High-Resolution Mass Analyzers -- 14.9 Matrix Interferences -- 14.10 Compensation Using Internal Standardization -- 14.11 Space Charge-Induced Matrix Interferences -- Chapter 15 Routine Maintenance -- 15.1 Sample-Introduction System -- 15.2 Peristaltic Pump Tubing -- 15.3 Nebulizers -- 15.4 Spray Chamber -- 15.5 Plasma Torch -- 15.6 Interface Region -- 15.7 Ion Optics -- 15.8 Roughing Pumps -- 15.9 Air Filters -- 15.10 Other Components to Be Periodically Checked -- 15.11 The Detector -- 15.12 Turbomolecular Pumps -- 15.13 Mass Analyzer and Collision/Reaction Cell -- 15.14 Final Thoughts -- Chapter 16 Sampling and Sample-Preparation Techniques -- 16.1 Collecting the Sample -- 16.2 Preparing the Sample -- 16.3 Cryogenic Grinding -- 16.4 Sample Dissolution -- 16.5 Reasons for Dissolving Samples -- 16.6 Digested Sample Weights -- 16.7 Microwave Digestion Considerations -- 16.8 Why Use Microwave Digestion? -- 16.9 Choice of Acids -- 16.10 Commercial Microwave Technology -- 16.11 Digestion Strategies -- 16.12 Fundamental Principles of Microwave Digestion Technology -- 16.13 Sequential Systems -- 16.14 Rotor-Based Technology -- 16.15 Single Reaction Chamber Technology -- 16.16 Single Cavity Mode.
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16.17 Principles of Single Cavity Mode -- 16.18 Automation with Single Cavity Mode -- 16.19 Sampling Procedures for Mercury -- 16.20 Reagent Blanks -- 16.21 Final Thoughts -- Chapter 17 A Practical Guide to Reducing Errors and Contamination Using Plasma Spectrochemistry -- 17.1 Understanding Data Accuracy and Precision -- 17.2 Estimating Error -- 17.3 Types of Errors -- 17.4 Standards and Reference Materials -- 17.5 Using Standards and Reference Materials -- 17.6 Calibration Curves -- 17.7 Dynamic Range, Concentration and Error -- 17.8 Laboratory Sources of Error and Contamination -- 17.9 Sources of Laboratory Contamination and Error -- 17.10 Water Quality -- 17.11 Reagents -- 17.12 Laboratory Environment and Personnel -- 17.13 General Principles and Practices -- Chapter 18 Performance- and Productivity-Enhancement Techniques -- 18.1 Performance-Enhancing Techniques Laser Ablation -- 18.2 Commercial Laser Ablation Systems for ICP-MS -- 18.3 Excimer Lasers -- 18.4 Benefits of Laser Ablation for ICP-MS -- 18.5 Optimum Laser Design Based on the Application Requirements -- 18.6 193-nm Laser Technology -- 18.7 Flow Injection Analysis -- 18.8 Electrothermal Vaporization (ETV) -- 18.9 Chilled Spray Chambers and Desolvation Devices -- 18.10 Water-Cooled and Peltier-Cooled Spray Chambers -- 18.11 Ultrasonic Nebulizers -- 18.12 Specialized Microflow Nebulizers with Desolvation Techniques -- 18.13 Direct Injection Nebulizers -- 18.14 Productivity-Enhancing Techniques -- 18.15 Faster Analysis Times -- 18.16 Automated In-Line Auto-Dilution and Auto-Calibration -- 18.17 Automated Sample Identification and Tracking -- Chapter 19 Coupling ICP-MS with Chromatographic Separation Techniques for Speciation Studies -- 19.1 HPLC Coupled with ICP-MS -- 19.2 Chromatographic Separation Requirements -- 19.3 Ion Exchange Chromatography (IEC).
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19.4 Reversed-Phase Ion-Pair Chromatography (RP-IPC) -- 19.5 Column Material -- 19.6 Isocratic or Gradient Elution -- 19.7 Sample-Introduction Requirements -- 19.8 Optimization of ICP-MS Parameters -- 19.9 Compatibility with Organic Solvents -- 19.10 Collision/Reaction Cell or Interface Capability -- 19.11 Optimization of Peak Measurement Protocol -- 19.12 Full Software Control and Integration -- 19.13 Final Thoughts -- Chapter 20 Overview of the ICP-MS Application Landscape -- 20.1 Application Capability -- 20.2 Analytical Challenges -- 20.3 Major Trends -- 20.4 What is Driving ICP-MS Development? -- 20.5 Future Direction -- Chapter 21 Fundamental Principles and Applications of Atomic Absorption and Atomic Fluorescence -- 21.1 Flame AAS -- 21.2 Advantages of FLAAS -- 21.3 FLAAS Interferences and Their Control -- 21.4 Disadvantages of FLAAS -- 21.5 Graphite-Furnace AAS -- 21.6 Advantages of GFAAS -- 21.7 GFAAS Interferences and Their Control -- 21.8 Advantages of GFAAS -- 21.9 Disadvantages of GFAAS -- 21.10 Vapor-Generation AAS -- 21.11 Advantages of Cold-Vapor AAS -- 21.12 Disadvantages of Cold-Vapor AAS -- 21.13 Hydride-Generation AAS -- 21.14 Advantages of Hydride-Generation AAS -- 21.15 Disadvantages of Hydride-Generation AAS -- 21.16 Hyphenated Techniques -- 21.17 Atomic Fluorescence -- 21.18 Advantages and Disadvantages of AFS -- 21.19 Final Thoughts -- Chapter 22 Fundamental Principles, Method Development and Operational Requirements of ICP-Optical Emission Spectroscopy -- 22.1 Basic Definitions -- 22.2 Principles of Emission -- 22.3 Atomic and Ionic Emission -- 22.4 Instrumentation -- 22.5 Sample Introduction -- 22.6 Aerosol Generation -- 22.7 Nebulizers -- 22.8 Spray Chambers -- 22.9 Torches -- 22.10 Spectrometers -- 22.11 Fore-Optics -- 22.12 Optical Designs -- 22.13 Detectors -- 22.14 Historical Perspective -- 22.15 Photomultiplier Tubes.
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22.16 Photodiode Arrays.
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