In:
Japanese Journal of Applied Physics, IOP Publishing, Vol. 51, No. 4R ( 2012-04-01), p. 042301-
Kurzfassung:
In this study, we investigate the effect of dielectric layer thickness on light reflection due to random self-assembled Ag nanoparticles with diameters of less than 160 nm deposited on the Si substrate, indicating that a dielectric layer with an appropriate thickness is useful for reducing the amount of reflected light. In the short wavelength range, reflectivity is determined by the metallic plasmon and the SiO 2 antireflection layer, and the effect of the surface plasmon dominates over the antireflection effect. In the long wavelength range, reflectivity decreases with increasing dielectric layer thickness and is determined by the oxide antireflection layer, while the effect of the surface plasmon is negligibly small. Moreover, the surface plasmon is affected by the SiO 2 layer and Si substrate when the dielectric layer is thin; however, it is only determined by the SiO 2 layer when the oxide layer is sufficiently thick. These observations have substantial applications for the optimization of surface-plasmon-enhanced silicon solar cells.
Materialart:
Online-Ressource
ISSN:
0021-4922
,
1347-4065
DOI:
10.1143/JJAP.51.042301
Sprache:
Unbekannt
Verlag:
IOP Publishing
Publikationsdatum:
2012
ZDB Id:
218223-3
ZDB Id:
797294-5
ZDB Id:
2006801-3
ZDB Id:
797295-7
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