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  • World Scientific Pub Co Pte Ltd  (2)
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  • World Scientific Pub Co Pte Ltd  (2)
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  • 1
    Online Resource
    Online Resource
    World Scientific Pub Co Pte Ltd ; 2019
    In:  Surface Review and Letters Vol. 26, No. 08 ( 2019-10), p. 1950045-
    In: Surface Review and Letters, World Scientific Pub Co Pte Ltd, Vol. 26, No. 08 ( 2019-10), p. 1950045-
    Abstract: The Au/Ti/HfO 2 /[Formula: see text]-GaAs metal/insulating layer/semiconductor structures have been fabricated using standard thermal atomic layer deposition. We experimentally showed whether or not the HfO 2 interfacial layer grown on the [Formula: see text]-GaAs wafer modifies the barrier height (BH) of the device at the room temperature. Besides, we investigated the measurement based on temperature dependence of the device parameters from the current–voltage ([Formula: see text] –[Formula: see text]) characteristics of the diode in 60–400[Formula: see text] K range with steps of 10[Formula: see text]K. The X-ray photoelectron spectroscopy (XPS) have been carried out to characterize the surfaces of both [Formula: see text] -GaAs wafer and HfO 2 thin films. The series resistance value from the temperature-dependent [Formula: see text]–[Formula: see text] characteristics decreased with decreasing temperature, which is a desired positive result for the devices developed from the MOS capacitor. The BH value of 0.94[Formula: see text]eV (300[Formula: see text] K) has been obtained for the device with the HfO 2 layer which is a higher value than the value of 0.77[Formula: see text]eV (300[Formula: see text] K) of the device without HfO 2 layer. Therefore, we can say that the HfO 2 thin layer at the metal/GaAs interface can also be used for the BH modification as a gate insulator for GaAs MOS capacitor and MOSFETs. When the temperature-dependent [Formula: see text]–[Formula: see text] characteristics at low temperatures have been considered, it has been observed that the current prefers to flow through the lowest BHs due to the BH inhomogeneities.
    Type of Medium: Online Resource
    ISSN: 0218-625X , 1793-6667
    Language: English
    Publisher: World Scientific Pub Co Pte Ltd
    Publication Date: 2019
    Location Call Number Limitation Availability
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  • 2
    Online Resource
    Online Resource
    World Scientific Pub Co Pte Ltd ; 2020
    In:  Surface Review and Letters Vol. 27, No. 07 ( 2020-07), p. 1950173-
    In: Surface Review and Letters, World Scientific Pub Co Pte Ltd, Vol. 27, No. 07 ( 2020-07), p. 1950173-
    Abstract: In this work, the La-doped ZnO thin films were fabricated with different La concentrations by the use of sol–gel technique to synthesize the photodevice. The transparent metal oxide La-doped ZnO thin films were grown on glass and [Formula: see text] -Si substrates using spin coating technique. Optical, surface morphology and electrical characterization of the fabricated Al/[Formula: see text]-Si/La:ZnO/Al devices have been performed using [Formula: see text] –[Formula: see text] and [Formula: see text] /[Formula: see text]–[Formula: see text] characteristics under dark and different illumination conditions. Herein, from [Formula: see text]–[Formula: see text] characteristics, the crucial electronic parameters such as barrier height, ideality factor and series resistance were investigated. The photodevice transient photocurrent increases with the increase of illumination intensity. The current ratios of [Formula: see text]/[Formula: see text] were calculated for the fabricated devices. Among the devices, the highest photoresponse was found to be about 2186 for the Al/[Formula: see text]-Si/La(0.5 wt.%):ZnO/Al structure. The [Formula: see text] –[Formula: see text] behavior of fabricated device confirms the presence of interface states. The obtained results and photoresponse behaviors suggested that Al/[Formula: see text] -Si/La:ZnO/Al devices can enhance the applications in optoelectronic devices such as photodetectors.
    Type of Medium: Online Resource
    ISSN: 0218-625X , 1793-6667
    Language: English
    Publisher: World Scientific Pub Co Pte Ltd
    Publication Date: 2020
    Location Call Number Limitation Availability
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