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  • Wiley-Blackwell  (4)
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  • 1
    ISSN: 1022-1352
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Physics
    Notes: Homogeneous and stable layers were deposited through allylamine plasma polymerization (75 W, 100 Pa, 15 min) onto poly[(3-hydroxybutyric acid)-co-(3-hydroxyvaleric acid)] (91 : 9 wt.-%) (P(HB-co-9%HV)) film surfaces, XPS analysis using take-off angles of 20° and 70° and performed 10 days and 20 days after plasma treatment gives information on the composition (in atom%) of the modified surface: C, 62.74; N, 19.60; O, 17.65. The unexpected oxygen percentage is weaker if argon plasma pretreatment (25 W, 40 Pa, 5 min) is applied. Then, a succinct mechanism is proposed. The study of changes in element ratios and binding energy values shows that the majority of incorporated functional groups seem to be amide and imine groups.
    Additional Material: 4 Ill.
    Type of Medium: Electronic Resource
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  • 2
    ISSN: 1022-1352
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Physics
    Notes: Poly[(3-hydroxybutyric acid)-co-(3-hydroxyvaleric acid)] (91:9 mass-%) (P(HB-co-9% HV)) film surfaces were modified by an oxygen plasma treatment (75 W, 50 Pa, 5 min). The number of oxygen atoms increases about 12-13% and the polar component of the surface energy increases from 6.3 to 21 mN · m-1. However, the wettability is stable only after 60 days. Untreated and treated film surfaces are studied by means of X-ray photoelectron spectroscopy with two different depth analyses. With storage time, the oxygen contents of the modified film is constant at a take-off angle of 20° but decreases to the initial value at a take-off angle of 70°. The superficial layer of the polymer film between the top of the film to a depth of 10 nm is divided into three superimposing zones. The interpretation is supported by motions of modified macromolecular chains and buried polar groups, chain cleavage and the formation of low-molecular-weight molecules which leads to a decrease of the glass transition temperature (plasticizer effect) and migration of short chains from the lowest modified zone toward the surface.
    Additional Material: 6 Ill.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 13 (1988), S. 186-192 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Selected methods for the XPS quantitation of surface coverages are summarized with an emphasis on non-planar samples with overlayers, e.g. powders of high surface area. Equations have been modified for uniform terminology and are presented based on a photoelectron spectrometer with an E-1 transmission function. Approaches which require a minimum of information from independent analytical techniques are given special consideration. Quantitative schemes discussed include calibration curves, surface sensitivity factors, exponential attenuation of bulk signals by overlayers, catalyst models, and the use of subshell twins or peak shape distortions related to photoelectron energy losses.
    Additional Material: 2 Tab.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 4 (1982), S. 197-203 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Integral area measurements of Auger intensities for various metal sulfides give comparable quantitative results to those obtained from derivative peak-to-peak heights. Highest precisions for sulfur sensitivity factors were obtained by: (a) intensity measurements involving integration of background-subtracted N(E) lineshapes, (b) matrix corrections for electron mean free path and backscattering factor, (c) the use of XPS-derived surface stoichiometries rather than assumed bulk stoichiometries for the metal sulfide standards. Despite the inherent inaccuracies of XPS quantitation, the XPS results help to correct for surface deviations from bulk stoichiometry owing to surface contamination, facile S surface oxidation, and preferential S loss usually observed during Ar+ sputter cleaning. The integral area Auger measurement techniques are particularly promising for electron-beam sensitive materials which often cannot be characterized using high primary electron doses and conventional energy-analyzer potential modulation differentiation.
    Additional Material: 3 Ill.
    Type of Medium: Electronic Resource
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