In:
MRS Proceedings, Springer Science and Business Media LLC, Vol. 658 ( 2000)
Abstract:
Thin films of NdNiO 3 were grown using pulsed laser deposition on single crystal substrates of [100]-oriented LaAlO 3 and SrTiO 3 . X-ray diffraction and reflectivity, scanning electron microscopy, and atomic force microscopy were used to characterize the chemical, morphological and structural traits of the thin films. Single-phase epitaxial films are grown on LaAlO 3 and SrTiO 3 at 625°C in an oxygen pressure of 200 mTorr. At higher temperatures, the films partially decompose to Nd 2 NiO 4 and NiO. The films are epitaxial with the (101) planes (orthorhombic Pnma notation) parallel to the substrate surface. Four in-plane orientational variants exist that correspond to the four 90° degenerate orientations of the film's [010] with respect to the in-plane substrate directions. Films are observed to be strained in accordance with the structural mismatch to the underlying substrate, and this leads, in the thinnest films on LaAlO 3 , to an apparent monoclinic distortion to the unit cell.
Type of Medium:
Online Resource
ISSN:
0272-9172
,
1946-4274
DOI:
10.1557/PROC-658-GG3.27
Language:
English
Publisher:
Springer Science and Business Media LLC
Publication Date:
2000
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