In:
Journal of Materials Research, Springer Science and Business Media LLC, Vol. 14, No. 4 ( 1999-04), p. 1235-1237
Abstract:
Silicon L 2,3 x-ray emission spectra (XES) of siloxene powder samples prepared according to Wöohler and Kautsky (Wöhler and Kautsky siloxene) are presented. The results are compared with the Si L 2,3 spectra of the reference compounds a -Si, c -Si, SiO 2 , and SiO x . A close similarity of the electronic structure of Wöhler siloxene to that of a -SiO 0.43 : H and of Kautsky siloxene to that of a -SiO 0.87 : H is found. We determine the number of oxygen atoms per Si atom at ~0.5 in Wöhler siloxene and ~0.8 in Kautsky siloxene. The relative concentrations are in good agreement with the results of infrared absorption measurements on the same samples.
Type of Medium:
Online Resource
ISSN:
0884-2914
,
2044-5326
DOI:
10.1557/JMR.1999.0168
Language:
English
Publisher:
Springer Science and Business Media LLC
Publication Date:
1999
detail.hit.zdb_id:
54876-5
detail.hit.zdb_id:
2015297-8
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