In:
Japanese Journal of Applied Physics, IOP Publishing, Vol. 51, No. 11R ( 2012-11-01), p. 110202-
Abstract:
Controlling defect structure in multiwalled carbon nanotube (MWCNT) is essential to realization of MWCNT devices. Here, we show that the diagram of the Raman intensity ratio of the G to D peaks and the G peak width can reveal two damaging stages of MWCNT films. In a transition period, additional peaks appeared in the X-ray absorption spectra, thereby indicating some significant change in the electronic structure. Also, a remarkable increase occurred in the diameter of the MWCNTs in the latter stage, suggesting the formation of dislocation dipoles which may relate to the change in the properties of field-emission devices.
Type of Medium:
Online Resource
ISSN:
0021-4922
,
1347-4065
DOI:
10.1143/JJAP.51.110202
Language:
Unknown
Publisher:
IOP Publishing
Publication Date:
2012
detail.hit.zdb_id:
218223-3
detail.hit.zdb_id:
797294-5
detail.hit.zdb_id:
2006801-3
detail.hit.zdb_id:
797295-7
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