In:
Journal of Physics D: Applied Physics, IOP Publishing, Vol. 44, No. 15 ( 2011-04-20), p. 155002-
Abstract:
We have developed a new methodology to study the effect of mechanical stress on spin waves in thin films deposited onto compliant substrates. It is based on micro-tensile tests combined with Brillouin light-scattering spectroscopy, which allows in situ probing of the magnetization dynamics of the studied film upon deformation. This paper shows from both theoretical and experimental approaches that the magneto-elastic coupling in the saturation regime leads to a simple linear relationship between the spin waves' frequency and the stress applied to the magnetic film. The linear part of the experimental data can be reproduced theoretically, assuming a complete strain transfer through the metallic film–compliant substrate interface.
Type of Medium:
Online Resource
ISSN:
0022-3727
,
1361-6463
DOI:
10.1088/0022-3727/44/15/155002
Language:
Unknown
Publisher:
IOP Publishing
Publication Date:
2011
detail.hit.zdb_id:
209221-9
detail.hit.zdb_id:
1472948-9
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