In:
Japanese Journal of Applied Physics, IOP Publishing, Vol. 27, No. 5R ( 1988-05-01), p. 849-
Abstract:
We have investigated the effects of refraction of X-rays in double-crystal topography in the (+, -) Bragg-Bragg asymmetric arrangement, in which the angle of incidence of X-rays is very small. It is shown that in a double-crystal topograph of a sample having an uneven surface, the refraction effect gives rise to diffraction contrasts corresponding to the shape of the sample surface. This effect can be applied to an examination of surface roughness of a crystal and to a determination of a refractive index in the X-ray region. An attempt to derive the refractive index for silicon crystals has been made. The derived value was found to be in good agreement with the nominal one.
Type of Medium:
Online Resource
ISSN:
0021-4922
,
1347-4065
Language:
Unknown
Publisher:
IOP Publishing
Publication Date:
1988
detail.hit.zdb_id:
218223-3
detail.hit.zdb_id:
797294-5
detail.hit.zdb_id:
2006801-3
detail.hit.zdb_id:
797295-7
Permalink