Keywords:
Materials -- Testing.
;
Materials -- Mechanical properties.
;
Electronic books.
Description / Table of Contents:
The techniques described in this book will permit access to the real-time dynamics of materials, surface processes, and chemical and biological reactions at various time scales.
Type of Medium:
Online Resource
Pages:
1 online resource (265 pages)
Edition:
1st ed.
ISBN:
9783642451522
Series Statement:
Springer Series in Materials Science Series ; v.193
URL:
https://ebookcentral.proquest.com/lib/geomar/detail.action?docID=1697982
DDC:
620.115
Language:
English
Note:
Intro -- Preface -- Contents -- 1 In-situ Characterization of Molecular Processes in Liquids by Ultrafast X-ray Absorption Spectroscopy -- Abstract -- 1.1 Introduction -- 1.2 X-ray Absorption Spectroscopy -- 1.2.1 Extended X-ray Absorption Fine Structure (EXAFS) -- 1.2.2 X-ray Absorption Near Edge Spectroscopy (XANES) -- 1.3 Methodology -- 1.4 Applications -- 1.4.1 Intramolecular Charge Transfer -- 1.4.2 Bond Formation in Bimetallic Complexes -- 1.4.3 Spin Cross-over in Fe(II)-Complexes -- 1.4.4 Dynamics of Pure Water -- 1.4.5 Solvation Dynamics and Hydrophobicity -- 1.4.6 Towards Biological Systems -- 1.5 Conclusion and Outlook -- References -- 2 In-situ X-ray Diffraction at Synchrotrons and Free-Electron Laser Sources -- Abstract -- 2.1 The Need for In-situ X-ray Observations -- 2.2 Advantages and Disadvantages of In-situ X-ray Diffraction -- 2.3 Selected Examples of In-situ X-ray Diffraction -- 2.3.1 Complex Transition Metal Oxides -- 2.3.1.1 Pulsed Laser Deposition (PLD) -- 2.3.1.2 Growth of YBa2Cu3O7-x -- 2.3.1.3 Experimental Set-Up -- 2.3.1.4 In-situ Surface X-ray Diffraction During Thin Film Growth -- 2.3.2 Experimental Results -- 2.3.3 Deeply Buried Interfaces -- 2.3.3.1 X-ray Reflectivity -- 2.3.3.2 High-Energy Microdiffraction -- 2.4 X-ray Free Electron Lasers -- 2.4.1 Source Parameters -- 2.4.2 Potential for In-situ Experiments at FELs -- 2.4.2.1 Coherent Diffraction Imaging (CDI) -- 2.4.2.2 X-ray Photon Correlation Spectroscopy (XPCS) -- 2.5 Summary -- References -- 3 In-situ Transmission Electron Microscopy -- Abstract -- 3.1 What is the In-situ TEM and Why It Is Important -- 3.2 A Brief History of In-situ Microscopy -- 3.3 In-situ TEM Technologies -- 3.3.1 In-situ Heating and Cooling TEM -- 3.3.1.1 Chemical Analysis at Elevated Temperatures -- 3.3.2 In-situ Gas Environmental TEM (ETEM) -- 3.3.2.1 Windows-Type Gas E-Cell.
,
3.3.2.2 Differentially Pumped Gas E-Cell -- 3.3.2.3 Spherical Aberration (Cs)-Corrected Gas ETEM -- 3.3.3 In-situ Liquid ETEM -- 3.3.3.1 Window-Type Liquid E-Cell -- 3.3.3.2 Liquid ETEM with an In-Column Differentially Pumped Liquid E-Cell -- 3.3.4 In-situ Biasing TEM -- 3.3.5 In-situ Nanomechanical TEM -- 3.3.5.1 Conventional Tensile Straining TEM Holder -- 3.3.5.2 MEMS-Based Straining TEM Holder -- 3.3.5.3 Nanoindentation TEM Holder -- 3.3.5.4 TEM Grid-Based Straining Holder -- 3.3.6 In-situ Lorentz TEM and In-situ Electron Holography for Imaging Magnetic or Electric Field Distribution -- 3.3.6.1 Lorentz TEM: Principle -- 3.3.6.2 Electron Holography: Principle -- 3.3.6.3 In-situ Lorentz TEM and In-situ Electron Holography -- 3.3.7 In-situ Ion Beam Irradiation TEM -- 3.4 Some Important Notes -- 3.4.1 In-situ TEM: Holders and Atomic Resolution -- 3.4.2 Effects of Electron Beam Irradiation -- 3.4.3 Digital Recording -- 3.4.4 Technical Challenges Ahead -- 3.5 Summary -- References -- 4 Ultrafast Transmission Electron Microscopy and Electron Diffraction -- Abstract -- 4.1 Introduction -- 4.2 Electron Sources -- 4.2.1 Electron Emission -- 4.2.2 Emitter Materials -- 4.3 Electron Pulse Propagation -- 4.4 Electron- and Laser-Material Interactions -- 4.4.1 Ultrafast Conditions in Matter -- 4.5 Time Resolution and Synchronization -- 4.5.1 Electron Pulse Profile -- 4.5.2 Synchronization at the Sample and Time Zero -- 4.6 Experimental Variations and Ultrafast Electron Detection -- 4.6.1 Single- Versus Multi-shot Experiments -- 4.6.2 Electron Detection Techniques -- 4.7 Conclusion -- References -- 5 In-situ and Kinetic Studies Using Neutrons -- Abstract -- 5.1 Introduction -- 5.2 Conditions Available for In-situ Studies -- 5.2.1 Temperature -- 5.2.2 Pressure and Stress -- 5.2.3 Magnetic Fields -- 5.2.4 Electric Fields.
,
5.2.5 Chemical Potential: Partial Pressure -- 5.3 Single-Shot Kinetic Experiments -- 5.3.1 Cement Hydration -- 5.3.2 Transition Between Ice-Phases -- 5.3.3 Crystallization of Glass-Phases -- 5.3.4 Crystallization Reactions and Extreme Conditions -- 5.3.5 Self-Assembly in Soft Matter -- 5.4 Stroboscopic Kinetic Experiments -- 5.4.1 Decomposition Kinetics -- 5.4.2 Switching Processes In Ferroelectrics and Piezoelectrics -- 5.4.3 Limitations of Stroboscopic Techniques -- 5.4.4 Magnetic Relaxation in Ferrofluids -- 5.5 Further Prospects of In-situ Investigations -- References -- 6 Scanning Tunneling Microscopy at Elevated Pressure -- Abstract -- 6.1 Introduction -- 6.1.1 Are High Pressures Necessary? -- 6.1.2 Why Can't We Use the Thermodynamic Back Door of Temperature? -- 6.2 High-Pressure Techniques -- 6.3 High-Pressure STM Instrumentation -- 6.3.1 Requirements for STM Under Catalytic Conditions -- 6.3.1.1 Atmospheric Pressures -- 6.3.1.2 Elevated Temperatures -- 6.3.1.3 Atmospheric Pressures Combined with Elevated Temperatures -- 6.3.1.4 Correlation with Catalytic Performance -- 6.3.1.5 Minimal Chemical Side Effects -- 6.3.1.6 Well-Prepared Model Catalysts -- 6.3.2 Design of the ReactorSTM -- 6.4 High-Pressure Observations -- 6.4.1 CO Oxidation: The Special Role of Surface Oxides -- 6.4.2 CO Oxidation: Roughness, Steps and Spontaneous Reaction Oscillations -- 6.4.3 NO Reduction: From LH to LH -- 6.5 Conclusion and Outlook -- References -- 7 Detectors for Electron and X-ray Scattering and Imaging Experiments -- Abstract -- 7.1 Detectors for Electrons -- 7.1.1 Introduction -- 7.1.2 Electron Image Recording Devices -- 7.1.2.1 Photographic Film -- 7.1.2.2 Imaging Plate -- 7.1.2.3 CCD-Based Indirect Electron Detector -- 7.1.3 Critical Parameters for Detector Characterization -- 7.1.3.1 Modulation Transfer Function -- 7.1.3.2 Detector Quantum Efficiency.
,
7.1.3.3 Dynamic Range -- 7.1.3.4 Linearity -- 7.1.3.5 Uniformity -- 7.1.3.6 Resolution and Pixel Size -- 7.1.4 Comparison of Electron Detectors -- 7.1.5 Direct Electron Detectors -- 7.1.5.1 The Active Pixel Sensor -- 7.1.5.2 The Direct CCD -- 7.1.5.3 Performance of a Direct CCD -- 7.2 Detectors for X-rays -- 7.2.1 Introduction -- 7.2.2 Storage Ring Based X-ray Sources -- 7.2.2.1 Source Developments -- 7.2.2.2 Examples of Detectors for In-situ Experiments at Storage Rings -- The Cornell AP-HPAD -- The PILATUS detector -- 7.2.3 Free-Electron Laser Based X-ray Sources -- 7.2.3.1 Source Developments -- 7.2.3.2 Requirements for X-ray Detectors for FEL Based Sources -- 7.2.3.3 The Adaptive Gain Integrating Pixel Detector Project -- 7.2.4 Outlook -- References -- Index.
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