GLORIA

GEOMAR Library Ocean Research Information Access

X

Your email was sent successfully. Check your inbox.

An error occurred while sending the email. Please try again.

Proceed reservation?

Export
  • 1
    Online Resource
    Online Resource
    Simultaneous atomic force and scanning tunneling microscopy study of the Ge(111)-c(2×8) surface
    American Vacuum Society ; 2010
    In:  Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena Vol. 28, No. 3 ( 2010-05-01), p. C4D1-C4D4
    Details
    In: Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena, American Vacuum Society, Vol. 28, No. 3 ( 2010-05-01), p. C4D1-C4D4
    Abstract: In this article, the authors present the simultaneous noncontact atomic force microscopy and scanning tunneling microscopy measurement of the Ge(111)-c(2×8) surface using PtIr-coated Si cantilevers at room temperature. In both frequency shift and time-averaged tunneling current images at constant-height mode, each atom was clearly resolved. The image contrasts differ because the time-averaged tunneling current image is more directly coupled with local density of states than the frequency shift image. They demonstrate the measurement of the site-specific scanning tunneling spectroscopy (STS) spectra, which are in good agreement with typical STS measurements. Moreover, they demonstrate the simultaneous measurements of site-specific frequency shift and tunneling current as a function of tip-sample distance curves. On the Ge(111)-c(2×8) surface, tunneling current dropped at the near-contact region where a strong tip-sample interaction force is observed.
    Type of Medium: Online Resource
    ISSN: 2166-2746 , 2166-2754
    URL: Article
    DOI: 10.1116/1.3305340
    RVK:
    UA 4922
    Language: English
    Publisher: American Vacuum Society
    Publication Date: 2010
    detail.hit.zdb_id: 3117331-7
    detail.hit.zdb_id: 1475429-0
    Location Call Number Limitation Availability
    BibTip Others were also interested in ...
    Online Resource
  • 2
    Online Resource
    Online Resource
    Structure of platinum ultrafine particles in Pt/C catalyst observed by scanning tunneling microscopy
    American Vacuum Society ; 1990
    In:  Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films Vol. 8, No. 1 ( 1990-01-01), p. 608-609
    Details
    In: Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, American Vacuum Society, Vol. 8, No. 1 ( 1990-01-01), p. 608-609
    Abstract: Ultrafine platinum metal particles (few nanometers in diameter) dispersed on the surface of a vacuum-deposited carbon film were examined by scanning tunnelling microscopy. In this system that simulates an industrial Pt/C supported metal catalyst, the observed shape of the Pt particles appeared close to hemispherical, bounded by several relatively flat faces. The particle shapes were fitted well with halves of cubo-octahedra, providing a model for the structure of ultrafine Pt metal particles in the industrial Pt/C supported metal catalysts.
    Type of Medium: Online Resource
    ISSN: 0734-2101 , 1520-8559
    URL: Article
    DOI: 10.1116/1.576352
    RVK:
    UA 4921
    Language: English
    Publisher: American Vacuum Society
    Publication Date: 1990
    detail.hit.zdb_id: 1475424-1
    detail.hit.zdb_id: 797704-9
    Location Call Number Limitation Availability
    BibTip Others were also interested in ...
    Online Resource
  • 3
    Online Resource
    Online Resource
    Development of ultrahigh vacuum-atomic force microscopy with frequency modulation detection and its application to electrostatic force measurement
    American Vacuum Society ; 1997
    In:  Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena Vol. 15, No. 4 ( 1997-07-01), p. 1543-1546
    Details
    In: Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena, American Vacuum Society, Vol. 15, No. 4 ( 1997-07-01), p. 1543-1546
    Abstract: We succeeded in high resolution force measurements by using a noncontact ultrahigh vacuum-atomic force microscope (UHV-AFM) with frequency modulation (FM) detection. We clearly observed adatoms and corner holes on the Si(111)7×7 reconstructed surface. Then we applied the noncontact UHV-AFM with FM detection to the high resolution measurement of the electrostatic force. We prevented deterioration of the spatial resolution of the topography by isolating the electrostatic interaction from van der Waals interaction. By simultaneous measurements of the topography and electrostatic force on a silicon oxide, a spatial resolution ∼15 Å of the electrostatic force was achieved.
    Type of Medium: Online Resource
    ISSN: 1071-1023 , 1520-8567
    URL: Article
    DOI: 10.1116/1.589396
    RVK:
    UA 4922
    Language: English
    Publisher: American Vacuum Society
    Publication Date: 1997
    detail.hit.zdb_id: 3117331-7
    detail.hit.zdb_id: 3117333-0
    detail.hit.zdb_id: 1475429-0
    Location Call Number Limitation Availability
    BibTip Others were also interested in ...
    Online Resource
  • 4
    Online Resource
    Online Resource
    Atomically resolved force microscopy
    American Vacuum Society ; 2013
    In:  Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films Vol. 31, No. 5 ( 2013-09-01)
    Details
    In: Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, American Vacuum Society, Vol. 31, No. 5 ( 2013-09-01)
    Abstract: Atomic force microscopy(AFM) with atomic resolution has opened up a new “atom world” based on the chemical nanoscale force. In the noncontact regime where a weak attractive chemical force appears, AFM has successfully achieved atomically resolved imaging of various surfaces. In the near-contact regime, where a strong attractive chemical force or Pauli repulsive force appears, AFM can map the force and potential even on insulator surfaces, it can identify the chemical species of individual atoms using the chemical force, manipulate embedded heterogeneous atoms vertically and laterally, image individual chemical bondsusing the Pauli repulsive force, and detect the energy gap opening induced by covalent bond formation in combination with scanning tunneling microscopy.
    Type of Medium: Online Resource
    ISSN: 0734-2101 , 1520-8559
    URL: Article
    DOI: 10.1116/1.4803094
    RVK:
    UA 4921
    Language: English
    Publisher: American Vacuum Society
    Publication Date: 2013
    detail.hit.zdb_id: 1475424-1
    detail.hit.zdb_id: 797704-9
    Location Call Number Limitation Availability
    BibTip Others were also interested in ...
    Online Resource
  • 5
    Online Resource
    Online Resource
    Molecular resolution investigation of tetragonal lysozyme (110) face in liquid by frequency-modulation atomic force microscopy
    American Vacuum Society ; 2010
    In:  Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena Vol. 28, No. 3 ( 2010-05-01), p. C4C11-C4C14
    Details
    In: Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena, American Vacuum Society, Vol. 28, No. 3 ( 2010-05-01), p. C4C11-C4C14
    Abstract: In order to determine the molecular structure by x-ray diffraction analysis, it is very important to grow high quality protein crystals. The molecular resolution imaging of soluble protein crystals such as the tetragonal lysozyme (110) face in saturated solution is demonstrated using frequency-modulation atomic force microscopy (FM-AFM). The surface structure of the (110) face and the crystallographic position of individual molecules were determined from molecular resolution images. For observation of protein crystals, FM-AFM is a favorable technique as an alternative to contact mode or amplitude-modulation AFM.
    Type of Medium: Online Resource
    ISSN: 2166-2746 , 2166-2754
    URL: Article
    DOI: 10.1116/1.3386383
    RVK:
    UA 4922
    Language: English
    Publisher: American Vacuum Society
    Publication Date: 2010
    detail.hit.zdb_id: 3117331-7
    detail.hit.zdb_id: 1475429-0
    Location Call Number Limitation Availability
    BibTip Others were also interested in ...
    Online Resource
  • 6
    Online Resource
    Online Resource
    Correlation between contact-electrified charge groups on a thin silicon oxide
    American Vacuum Society ; 1996
    In:  Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena Vol. 14, No. 2 ( 1996-03-01), p. 1055-1059
    Details
    In: Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena, American Vacuum Society, Vol. 14, No. 2 ( 1996-03-01), p. 1055-1059
    Abstract: Proximity effects of charge groups deposited by contact electrification on thin silicon oxide in air were investigated using a modified atomic force microscope. For initial separations L of L∼3.0 μm, oppositely charged groups recede from each other in distance with time after contact electrification. On the other hand, a couple of negative (unipolar) charge groups approach each other with time. These features are contrary to the expected approach or recession due to the Coulomb attractive or repulsive force, respectively. Furthermore, the critical time tc of a stable–unstable phase transition of negative charges becomes shorter or longer due to the proximity effects by the opposite or same charge groups, respectively. These proximity effects seem to be induced by the interplay of the Coulomb force and the surface charge diffusion.
    Type of Medium: Online Resource
    ISSN: 1071-1023 , 1520-8567
    URL: Article
    DOI: 10.1116/1.588399
    RVK:
    UA 4922
    Language: English
    Publisher: American Vacuum Society
    Publication Date: 1996
    detail.hit.zdb_id: 3117331-7
    detail.hit.zdb_id: 3117333-0
    detail.hit.zdb_id: 1475429-0
    Location Call Number Limitation Availability
    BibTip Others were also interested in ...
    Online Resource
  • 7
    Online Resource
    Online Resource
    Analysis of frictional-force image patterns of a graphite surface
    American Vacuum Society ; 1997
    In:  Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena Vol. 15, No. 4 ( 1997-07-01), p. 1479-1482
    Details
    In: Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena, American Vacuum Society, Vol. 15, No. 4 ( 1997-07-01), p. 1479-1482
    Abstract: We discuss the mechanism of image patterns of the frictional-force microscopy (FFM) of a graphite surface by using a three-dimensional model comprised of a tip connected to a cantilever and a substrate surface. A simulated FFM image is in good agreement with an experimental one. A stable domain of the tip atom position can be defined in an analytic way. In the frictional-force regime, more than one quasistable tip atom position are mapped into a single cantilever basal position. Part of the boundary of the two-dimensional domain of the cantilever basal position appears as a fringe between the bright and the dark areas along the scan direction of the FFM image. General features of FFM images can be completely understood by this analysis.
    Type of Medium: Online Resource
    ISSN: 1071-1023 , 1520-8567
    URL: Article
    DOI: 10.1116/1.589479
    RVK:
    UA 4922
    Language: English
    Publisher: American Vacuum Society
    Publication Date: 1997
    detail.hit.zdb_id: 3117331-7
    detail.hit.zdb_id: 3117333-0
    detail.hit.zdb_id: 1475429-0
    Location Call Number Limitation Availability
    BibTip Others were also interested in ...
    Online Resource
  • 8
    Online Resource
    Online Resource
    Detection mechanism of an optical evanescent field using a noncontact mode atomic force microscope with a frequency modulation detection method
    American Vacuum Society ; 1997
    In:  Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena Vol. 15, No. 4 ( 1997-07-01), p. 1512-1515
    Details
    In: Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena, American Vacuum Society, Vol. 15, No. 4 ( 1997-07-01), p. 1512-1515
    Abstract: By using the noncontact atomic force microscope with a frequency modulation detection method, the force gradient induced by the optical evanescent field was detected in a high vacuum. We succeeded in measuring the exponential distance dependence of the force gradient induced by the optical evanescent field. Furthermore, we investigated the incident beam intensity and bias voltage dependence of the force gradient induced by the optical evanescent field. We confirmed that the detection mechanism is not photothermal effect but the surface photovoltage effect.
    Type of Medium: Online Resource
    ISSN: 1071-1023 , 1520-8567
    URL: Article
    DOI: 10.1116/1.589485
    RVK:
    UA 4922
    Language: English
    Publisher: American Vacuum Society
    Publication Date: 1997
    detail.hit.zdb_id: 3117331-7
    detail.hit.zdb_id: 3117333-0
    detail.hit.zdb_id: 1475429-0
    Location Call Number Limitation Availability
    BibTip Others were also interested in ...
    Online Resource
Close ⊗
This website uses cookies and the analysis tool Matomo. More information can be found here...