Publication Date:
2012-08-08
Description:
Author(s): Daniel Sank, R. Barends, Radoslaw C. Bialczak, Yu Chen, J. Kelly, M. Lenander, E. Lucero, Matteo Mariantoni, A. Megrant, M. Neeley, P. J. J. O’Malley, A. Vainsencher, H. Wang, J. Wenner, T. C. White, T. Yamamoto, Yi Yin, A. N. Cleland, and John M. Martinis We measure the dependence of qubit phase coherence and flux noise on inductor loop geometry. While wider inductor traces change neither the flux noise power spectrum nor the qubit dephasing time, increased inductance leads to a simultaneous increase in both. Using our new tomographic protocol for me... [Phys. Rev. Lett. 109, 067001] Published Tue Aug 07, 2012
Keywords:
Condensed Matter: Electronic Properties, etc.
Print ISSN:
0031-9007
Electronic ISSN:
1079-7114
Topics:
Physics
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