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Influence of exchange bias on magnetic losses in CoFeB/MgO/CoFeB tunnel junctions (2012)

Ryan Stearrett, W. G. Wang, Xiaoming Kou, J. F. Feng, J. M. D. Coey, J. Q. Xiao, and E. R. Nowak

American Physical Society (APS)

In: Physical Review B

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Publication Date: 2012-07-17

Description: Author(s): Ryan Stearrett, W. G. Wang, Xiaoming Kou, J. F. Feng, J. M. D. Coey, J. Q. Xiao, and E. R. Nowak The strength of the exchange bias field is found to influence the low-frequency magnetoresistive noise associated with the magnetic reference layer in sputtered-deposited and electron-beam-evaporated CoFeB/MgO/CoFeB tunnel junctions. The noise is due to magnetic losses arising in the reference layer... [Phys. Rev. B 86, 014415] Published Mon Jul 16, 2012

Keywords: Magnetism

Print ISSN: 1098-0121

Electronic ISSN: 1095-3795

Topics: Physics

Published by American Physical Society (APS)

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