Publication Date:
2012-07-17
Description:
Author(s): Ryan Stearrett, W. G. Wang, Xiaoming Kou, J. F. Feng, J. M. D. Coey, J. Q. Xiao, and E. R. Nowak The strength of the exchange bias field is found to influence the low-frequency magnetoresistive noise associated with the magnetic reference layer in sputtered-deposited and electron-beam-evaporated CoFeB/MgO/CoFeB tunnel junctions. The noise is due to magnetic losses arising in the reference layer... [Phys. Rev. B 86, 014415] Published Mon Jul 16, 2012
Keywords:
Magnetism
Print ISSN:
1098-0121
Electronic ISSN:
1095-3795
Topics:
Physics
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