ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
Interfacial reactions between titanium and cordierite-based (2MgO⋅2Al2O3⋅5SiO2) ceramic thin films are probed using x-ray photoelectron spectroscopy. Upon initial room-temperature submonolayer titanium deposition the SiO substrate bonds begin to dissociate, and subsequent deposition results in AlO bond dissociation with low valency Ti oxide formation at the interface. Upon subsequent annealing in vacuum titanium strongly reduces the SiO and AlO bonds, but no observable reduction of the MgO bond is found. Furthermore, between 600 and 700 °C the metallic Al reduces the remaining SiO bonds, with AlO bonds reforming. These results are in qualitative agreement with bulk thermodynamic considerations and this study represents the first comprehensive treatment of the interfacial reactions in metal-multicomponent ceramic systems.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.341712
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