In:
American Journal of Physics, American Association of Physics Teachers (AAPT), Vol. 77, No. 2 ( 2009-02-01), p. 104-110
Abstract:
Optical spectral analysis and multispectral imaging provide powerful means for characterizing samples in a wide variety of applications and on many spatial scales. We present a simple implementation of these techniques in the context of microscopy. A modified commercial microscope equipped with a CMOS imaging detector, combined with an array of light emitting diodes with emission ranging from ultraviolet to near-infrared wavelengths, is described, and examples of information enhancement using multivariate analysis are presented.
Type of Medium:
Online Resource
ISSN:
0002-9505
,
1943-2909
Language:
English
Publisher:
American Association of Physics Teachers (AAPT)
Publication Date:
2009
detail.hit.zdb_id:
1472799-7
detail.hit.zdb_id:
2947-6
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