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  • Acta Physica Sinica, Chinese Physical Society and Institute of Physics, Chinese Academy of Sciences  (41)
  • 1
    Online Resource
    Online Resource
    Acta Physica Sinica, Chinese Physical Society and Institute of Physics, Chinese Academy of Sciences ; 2010
    In:  Acta Physica Sinica Vol. 59, No. 4 ( 2010), p. 2471-
    In: Acta Physica Sinica, Acta Physica Sinica, Chinese Physical Society and Institute of Physics, Chinese Academy of Sciences, Vol. 59, No. 4 ( 2010), p. 2471-
    Abstract: Deconvolution methods are not feasible in spectral domain optical coherence tomography (SD-OCT) system due to the linear space variant property of its axial point spread function (PSF). In order to improve the axial resolution and enhance the imaging quality of the SD-OCT system, a Lucy-Richardson algorithm based deconvolution method is implemented with the numerically compensated A-scan signals and the effective axial PSF in this paper. The main factors decreasing the value of PSF along the axial direction and blurring the images, as well as the deconvolution process, are theoretical studied. With the developed SD-OCT system, the axial modulation function of the PSF is retrieved by curve fitting of the measured peak values of the PSF at different axial positions. After compensating the A-scan signal with the modulation function, deconvolution is performed with the measured effective axial PSF. In vivo imaging on typical samples is conducted and reconstruction is done based on the deconvolution method. The comparing results demonstrate that the proposed deconvolution method not only enhances the axial resolution but also improves the depth dependent sensitivity fall-off in SD-OCT system.
    Type of Medium: Online Resource
    ISSN: 1000-3290 , 1000-3290
    Language: Unknown
    Publisher: Acta Physica Sinica, Chinese Physical Society and Institute of Physics, Chinese Academy of Sciences
    Publication Date: 2010
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  • 2
    In: Acta Physica Sinica, Acta Physica Sinica, Chinese Physical Society and Institute of Physics, Chinese Academy of Sciences, Vol. 54, No. 5 ( 2005), p. 2172-
    Abstract: The microstructures of hydrogenated microcrystalline silicon (μc-Si:H) thin fil ms, prepared by plasma-enhanced chemical vapor deposition (PECVD), hot wire CVD( HWCVD) and plasma assisted HWCVD (PE-HWCVD), have been analyzed by the small ang le x_ray scattering(SAXS) measurement. The SAXS data show that the microstructur es of the μc-Si:H films display different characteristics for different deposit ion techniques. For films deposited by PECVD, the volume fraction of micro-voids and mean size are smaller than those in HWCVD sample. Aided by suitable ion-bom bardment, PE-HWCVD samples show a more compact structure than the HWCVD sample. The microstructure parameters of the μc-Si:H thin films deposited by two-steps HWCVD and PE-HWCVD with Ar ions are evidently improved. The result of 45° tilti ng SAXS measurement indicates that the distribution of micro-voids in the film i s anisotropic. The Fouriertransform infrared spectra confirm the SAXS data.
    Type of Medium: Online Resource
    ISSN: 1000-3290 , 1000-3290
    Language: Unknown
    Publisher: Acta Physica Sinica, Chinese Physical Society and Institute of Physics, Chinese Academy of Sciences
    Publication Date: 2005
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  • 3
    Online Resource
    Online Resource
    Acta Physica Sinica, Chinese Physical Society and Institute of Physics, Chinese Academy of Sciences ; 2005
    In:  Acta Physica Sinica Vol. 54, No. 4 ( 2005), p. 1890-
    In: Acta Physica Sinica, Acta Physica Sinica, Chinese Physical Society and Institute of Physics, Chinese Academy of Sciences, Vol. 54, No. 4 ( 2005), p. 1890-
    Abstract: Microcrystalline silicon thin films at different growth stages were prepared by hot wire chemical vapor deposition. Atomic force microscopy has been applied to investigate the evolution of surface topography of these films. According to the fractal analysis, it was found that, the growth of Si film deposited on glass substrate is the zero_diffused stochastic deposition; while for the film on Si substrate, it is the finite diffused deposition on the initial growth stage, and transforms to the zero_diffused stochastic deposition when the film thickness reaches a certain value. The film thickness dependence of island density shows that a maximum of island density appears at the critical film thickness for both substrates. The data of Raman spectra approve that, on the glass substrate, the a_Si:H/μc_Si:H transition is related to the critical film thickness. Different substrate materials directly affect the surface diffusion ability of radicals, resu lting in the difference of growth modes on the earlier growth stage.
    Type of Medium: Online Resource
    ISSN: 1000-3290 , 1000-3290
    Language: Unknown
    Publisher: Acta Physica Sinica, Chinese Physical Society and Institute of Physics, Chinese Academy of Sciences
    Publication Date: 2005
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  • 4
    Online Resource
    Online Resource
    Acta Physica Sinica, Chinese Physical Society and Institute of Physics, Chinese Academy of Sciences ; 2006
    In:  Acta Physica Sinica Vol. 55, No. 8 ( 2006), p. 4188-
    In: Acta Physica Sinica, Acta Physica Sinica, Chinese Physical Society and Institute of Physics, Chinese Academy of Sciences, Vol. 55, No. 8 ( 2006), p. 4188-
    Abstract: Based on the results of the X-ray diffraction experiment, we implement the fractal concept to study the liquid structure of In-80wt% Sn at 300℃. Partially-overlapping multirange fractals in the melt In-80wt%Sn are observed. According to the characteristic of the partially-overlapping multirange fractals, a model of multirange fractals in liquid structure is proposed and the simulated results agree with the experimental data, where the relative error is less than 1.5%. From the fractal analysis, the whole structure of liquid is clearly revealed, and the range of the transition region between the fractals is speculated to be related closely with the properties of the liquid alloys,and the changes of the transition region may disclose the changes of the liquid alloy characteristics.
    Type of Medium: Online Resource
    ISSN: 1000-3290 , 1000-3290
    Language: Unknown
    Publisher: Acta Physica Sinica, Chinese Physical Society and Institute of Physics, Chinese Academy of Sciences
    Publication Date: 2006
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  • 5
    In: Acta Physica Sinica, Acta Physica Sinica, Chinese Physical Society and Institute of Physics, Chinese Academy of Sciences, Vol. 71, No. 18 ( 2022), p. 184501-
    Abstract: Dry granular materials are composed of a dense random packing of macroscopic grains. As a small amount of liquid is added to granular samples, the liquid bridge forces, i.e. the forces between liquid and the grains, have an influence on the mechanical properties of wet granular material, and some of these properties are quite different from those of dry granular materials. In this work, by measuring the acceleration of the sample chamber and the force exerted on it by the shaker, the variations of bulk modulus and energy dissipation of both dry and wet glass bead samples with pressure and viscosity under vertical vibration are studied. The results are shown below. 1) Under low saturation, the bulk modulus of dry and wet glass bead sample are both described by a power law scaling law with pressure, which is close to the power law relationship predicted by the efficient medium theory on the basis of Hertz contact potential. A small amount of liquid can increase the bulk modulus of glass bead sample. At the same pressure and liquid content, the bulk modulus of wet glass bead sample increases with liquid viscosity increasing. Based on Hertzian contact mechanics, an efficient elastic network model is proposed to illustrate the mechanism of increasing bulk modulus of wet glass bead samples. 2) The energy dissipation of dry and wet glass bead sample decrease following the power law of pressure, and the energy dissipation of wet glass bead samples is proportional to the kinematic viscosity of liquid. 3) With the increase of strain amplitude, the softening behavior of the wet glass bead sample is similar to that of the dry glass bead sample, when the strain amplitude is higher than the strain threshold value. The kinematic viscosity of liquid inhibits the softening behavior of glass bead sample.
    Type of Medium: Online Resource
    ISSN: 1000-3290 , 1000-3290
    Language: Unknown
    Publisher: Acta Physica Sinica, Chinese Physical Society and Institute of Physics, Chinese Academy of Sciences
    Publication Date: 2022
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  • 6
    In: Acta Physica Sinica, Acta Physica Sinica, Chinese Physical Society and Institute of Physics, Chinese Academy of Sciences, Vol. 58, No. 12 ( 2009), p. 8419-
    Abstract: A classical trajectory Monte Carlo method is used to investigate the collision ionization of H by He2+ in Debye plasma, and the total and differential cross sections are obtained for collision energies of 5—400 keV/u in a large plasma parameter range. The interaction between charged particles is described by the Debye-Hückel model. Plasma screening changes the ionization energy and classical microcanonical distribution of bound electrons and the interaction between electron and the projectile, which result in the modification of ionization cross sections. It is found that both the total and differential cross sections increase with the increasing of screening interaction, and especially for energies below 10 keV/u, the cross sections are one to two magnitudes larger than those in the unscreened case. The emitted electron moves to the higher energy range, and the binary-encounter ionization mechanism becomes more important and a new hump appears due to the screening effect. Our unscreened cross section is in a good agreement with the experimental measurement for collision energies beyond 70 keV/u.
    Type of Medium: Online Resource
    ISSN: 1000-3290 , 1000-3290
    Language: Unknown
    Publisher: Acta Physica Sinica, Chinese Physical Society and Institute of Physics, Chinese Academy of Sciences
    Publication Date: 2009
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  • 7
    In: Acta Physica Sinica, Acta Physica Sinica, Chinese Physical Society and Institute of Physics, Chinese Academy of Sciences, Vol. 71, No. 14 ( 2022), p. 143201-
    Abstract: The interaction of extreme ultraviolet (XUV) photon with matter is a meaningful way to understand the electronic structure of microscopic particles. In this paper, the electron angular distributions of single ionization and double ionization of Ne and Xe atoms interacting with XUV photons are investigated by utilizing a reaction microscope. The 〈i〉β〈/i〉-asymmetric parameters of 2p electrons of Ne atom, and 5p, 5s electrons of Xe atom combined with the reported experimental data are compared with those from different theoretical models. The result shows that the electron correlation effect can be ignored in the ionization of 2p electron of Ne atom. While the ionization of 5p electron of Xe atom is strongly influenced by the electron correlation effect, but not by the relativistic effect. These two effects play an important role in ionizing the 5s shell of Xe atom. In addition, this study finds that both direct double ionization and indirect double ionization exist simultaneously during the ionization of Xe atom, and gives the photoelectron angular distributions and the 〈i〉β〈/i〉-asymmetric parameters of the first step and the second step of indirect double ionization.
    Type of Medium: Online Resource
    ISSN: 1000-3290 , 1000-3290
    Language: Unknown
    Publisher: Acta Physica Sinica, Chinese Physical Society and Institute of Physics, Chinese Academy of Sciences
    Publication Date: 2022
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  • 8
    In: Acta Physica Sinica, Acta Physica Sinica, Chinese Physical Society and Institute of Physics, Chinese Academy of Sciences, Vol. 70, No. 3 ( 2021), p. 037801-
    Abstract: As a new family member of two-dimensional materials, black phosphorus has attracted much attention due to its infrared band gap and strongly anisotropic properties, bringing new concepts and applications in different fields. In characterizing black phosphorus, optical method and electrical method are typically used to obtain structural information and fundamental properties in terms of behaviors of electrons. So far, more studies are still needed to understand in depth the physical principle and facilitate applications. In this paper, multilayered black phosphorus flakes are synthesized via mechanical exfoliation from the bulk crystal, and field-effect transistors based on few-layer black phosphorus are fabricated by micro-nano fabrication technology, which owns 0°–360° four pairs of symmetrical electrodes. We experimentally obtain the characteristics of Raman modes 〈inline-formula〉〈tex-math id="M1"〉\begin{document}${\rm{A}}_{\rm{g}}^{\rm{1}}$\end{document}〈/tex-math〉〈alternatives〉〈graphic xmlns:xlink="http://www.w3.org/1999/xlink" xlink:href="3-20201271_M1.jpg"/〉〈graphic xmlns:xlink="http://www.w3.org/1999/xlink" xlink:href="3-20201271_M1.png"/〉〈/alternatives〉〈/inline-formula〉, 〈inline-formula〉〈tex-math id="Z-20210129033546-1"〉\begin{document}$ {\rm B_{2g}} $\end{document}〈/tex-math〉〈alternatives〉〈graphic xmlns:xlink="http://www.w3.org/1999/xlink" xlink:href="3-20201271_Z-20210129033546-1.jpg"/〉〈graphic xmlns:xlink="http://www.w3.org/1999/xlink" xlink:href="3-20201271_Z-20210129033546-1.png"/〉〈/alternatives〉〈/inline-formula〉, and 〈inline-formula〉〈tex-math id="M2"〉\begin{document}${\rm{A}}_{\rm{g}}^2$\end{document}〈/tex-math〉〈alternatives〉〈graphic xmlns:xlink="http://www.w3.org/1999/xlink" xlink:href="3-20201271_M2.jpg"/〉〈graphic xmlns:xlink="http://www.w3.org/1999/xlink" xlink:href="3-20201271_M2.png"/〉〈/alternatives〉〈/inline-formula〉 in parallel (〈i〉XX〈/i〉) and vertical (〈i〉XY〈/i〉) polarization configuration. Furthermore, the angle-dependent source-drain current angle is measured through a BP field-effect transistor. The Raman spectrum results demonstrate that three characteristic peaks are located at 361, 439 and 467 cm〈sup〉–1〈/sup〉 in a range of 200–500 cm〈sup〉–1〈/sup〉, corresponding to the vibration modes of 〈inline-formula〉〈tex-math id="M3"〉\begin{document}${\rm{A}}_{\rm{g}}^{\rm{1}}$\end{document}〈/tex-math〉〈alternatives〉〈graphic xmlns:xlink="http://www.w3.org/1999/xlink" xlink:href="3-20201271_M3.jpg"/〉〈graphic xmlns:xlink="http://www.w3.org/1999/xlink" xlink:href="3-20201271_M3.png"/〉〈/alternatives〉〈/inline-formula〉, 〈inline-formula〉〈tex-math id="Z-20210129033614-1"〉\begin{document}$ {\rm B_{2g}}, $\end{document}〈/tex-math〉〈alternatives〉〈graphic xmlns:xlink="http://www.w3.org/1999/xlink" xlink:href="3-20201271_Z-20210129033614-1.jpg"/〉〈graphic xmlns:xlink="http://www.w3.org/1999/xlink" xlink:href="3-20201271_Z-20210129033614-1.png"/〉〈/alternatives〉〈/inline-formula〉 and 〈inline-formula〉〈tex-math id="M4"〉\begin{document}${\rm{A}}_{\rm{g}}^2$\end{document}〈/tex-math〉〈alternatives〉〈graphic xmlns:xlink="http://www.w3.org/1999/xlink" xlink:href="3-20201271_M4.jpg"/〉〈graphic xmlns:xlink="http://www.w3.org/1999/xlink" xlink:href="3-20201271_M4.png"/〉〈/alternatives〉〈/inline-formula〉, respectively. The fitting experimental data of polarization-dependent Raman spectra also show that the intensity for each of the three characteristic peaks has a 180° periodic variation in a parallel polarization configuration and also in a vertical polarization configuration. The maximum Raman intensity of A〈sub〉g〈/sub〉 is along the AC direction, while that of B〈sub〉2g〈/sub〉 is along the ZZ direction. On the other hand, the electric transport curves illustrate that the largest source leakage current can be obtained near 0° (180°) armchair direction. Such results indicate the anisotropy of black phosphorus. Furthermore, transfer curves with different electrode angles show that the weak bipolarity of black phosphorus at 45° (225°), 90° (270°), and p-type performance at 0° (180°), 135° (315°) can be offered, respectively. This work is conducive to studying the properties and practical applications of devices based on black phosphorus.
    Type of Medium: Online Resource
    ISSN: 1000-3290 , 1000-3290
    Language: Unknown
    Publisher: Acta Physica Sinica, Chinese Physical Society and Institute of Physics, Chinese Academy of Sciences
    Publication Date: 2021
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  • 9
    Online Resource
    Online Resource
    Acta Physica Sinica, Chinese Physical Society and Institute of Physics, Chinese Academy of Sciences ; 2010
    In:  Acta Physica Sinica Vol. 59, No. 11 ( 2010), p. 8071-
    In: Acta Physica Sinica, Acta Physica Sinica, Chinese Physical Society and Institute of Physics, Chinese Academy of Sciences, Vol. 59, No. 11 ( 2010), p. 8071-
    Abstract: Structural stability,electronic and optical properties of Ni-doped silicon nanowires are investigated by first-principles calculations based on the density functional theory. The results show that Ni can preferentially occupy substitutional sites near the surface of silicon nanowire. The doping of Ni atom in silicon nanowire introduces the impurity levels. The impurity level is mainly contributed by Ni 3d orbital. The decrease of the band gap results from the coupling of Ni 3d and Si 3p states. A strong absorption peak occurs in the low energy region of Ni-doped silicon nanowire,accompanied by the widening of the absorption band.
    Type of Medium: Online Resource
    ISSN: 1000-3290 , 1000-3290
    Language: Unknown
    Publisher: Acta Physica Sinica, Chinese Physical Society and Institute of Physics, Chinese Academy of Sciences
    Publication Date: 2010
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  • 10
    Online Resource
    Online Resource
    Acta Physica Sinica, Chinese Physical Society and Institute of Physics, Chinese Academy of Sciences ; 2016
    In:  Acta Physica Sinica Vol. 65, No. 1 ( 2016), p. 014201-
    In: Acta Physica Sinica, Acta Physica Sinica, Chinese Physical Society and Institute of Physics, Chinese Academy of Sciences, Vol. 65, No. 1 ( 2016), p. 014201-
    Abstract: There are intrinsic phase errors in swept source optical coherence tomography (SS-OCT), which severely influences the functional imaging. To overcome this difficulty, a numerical correction method is presented in this paper to correct the phase artifacts due to wavenumber shift among the spectral interferograms, resulting from the random delay variance between the sampling trigger and the clock of the swept source laser. This correction method is based on the linear relationship of phase difference to the depth of the sample and the wavenumber shift. The detailed procedure to eliminate the phase artifacts is as follows. Firstly, we figure out the complex OCT signals through inverse Fourier transform of the initial interferograms. Then we fit the upper surface of the sample with the intensity information of the B-scan by setting a floating threshold. After that the wavenumber shifts of each A-line are determined by two steps with the phase information of the sample surface: the relative wavenumber shifts between adjacent A-lines are first obtained according to the phase difference between the adjacent A-lines, the signal depth, and the linear relationship mentioned above; then we figure out the absolute wavenumber shifts between each A-line and the first A-line of the B-scan by an iteration algorithm. With the information about the wavenumber shift, we align the initial interferograms, and obtain the corrected complex signal through re-inverse Fourier transform of the aligned interferograms. This method introduces no extra noise, realizing phase measurement limited by the signal-to-noise ratio. It is noted that we take the average phase information of several axial pixels near the sample surface to diminish the noise influence when calculating the wavenumber shifts. Besides, this corrected algorithm acquires oversampling along the scanning direction to ensure the signal correlation between adjacent A-lines. The SS-OCT system in the paper is set up with a vertical cavity surface emitting laser with a center wavelength of 1297 nm. The system measurement range is 12 mm in lateral direction, the axial resolution is 17 m, and the lateral resolution is 24 m. And the feasibility of this method is verified by Doppler imaging of a mirror, an infra-red detection card and the cerebral cortex of a mouse.
    Type of Medium: Online Resource
    ISSN: 1000-3290 , 1000-3290
    Language: Unknown
    Publisher: Acta Physica Sinica, Chinese Physical Society and Institute of Physics, Chinese Academy of Sciences
    Publication Date: 2016
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