In:
Journal of Applied Physics, AIP Publishing, Vol. 81, No. 3 ( 1997-02-01), p. 1331-1334
Abstract:
The temperature dependence of the out-of-plane and in-plane resistance of a c-axis-oriented (Bi,Pb)2Sr2Ca2Cu3O x silver-sheathed tape with high critical current density (Jc & gt;2×104 A/cm2, 77 K, 0 T) has been investigated under applied fields up to 0.9 T. It is found that the in-plane and the out-of-plane resistance transitions are quite different: (1) The out-of-plane zero resistance temperature is much higher than the in-plane one, i.e., Tcab(H)≪Tcc(H), and the difference increases with magnetic field; (2) the out-of-plane zero resistance temperature corresponds to the c-axis decoupling temperature. These phenomena are attributed to different dissipation mechanisms. The in-plane dissipation at low temperature results from the thermally activated flux–flow, while the out-of-plane dissipation originates from the Josephson junction dissipation of weakly coupled c-axis grain boundaries and/or intrinsic Josephson junctions.
Type of Medium:
Online Resource
ISSN:
0021-8979
,
1089-7550
Language:
English
Publisher:
AIP Publishing
Publication Date:
1997
detail.hit.zdb_id:
220641-9
detail.hit.zdb_id:
3112-4
detail.hit.zdb_id:
1476463-5
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