In:
Japanese Journal of Applied Physics, IOP Publishing, Vol. 10, No. 1 ( 1971-01-01), p. 1-
Abstract:
A tensile device is developed which enables one to determine the stress-strain relationship of a specimen being extended during electron microscopic observation. The minimum detectable increment of load is about 0.01 g and the minimum detectable elongation is about 0.1%. Yield points of foils of Al and other metals are observable by 500 kV electron microscopy along the stress-strain curves.
Type of Medium:
Online Resource
ISSN:
0021-4922
,
1347-4065
Language:
Unknown
Publisher:
IOP Publishing
Publication Date:
1971
detail.hit.zdb_id:
218223-3
detail.hit.zdb_id:
797294-5
detail.hit.zdb_id:
2006801-3
detail.hit.zdb_id:
797295-7
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