In:
Review of Scientific Instruments, AIP Publishing, Vol. 43, No. 3 ( 1972-03-01), p. 544-547
Abstract:
A depth gauge useful in measuring the thickness of thin liquid films is described. The gauge operates on the principle of an end effect capacitance variation and offers the advantage that no part of the gauge protrudes into the liquid flow. Amplitude and frequency characteristics of the interface waves may also be measured with the gauge. The gauge has been utilized to measure the thickness and interface wave characteristics of a liquid film interacting with a supersonic gas flow. The data suggest that the gauge can sense wave frequencies up to 500 Hz provided the mean wavelength is an order of magnitude larger than the streamwise dimension of the gauge sensing elements.
Type of Medium:
Online Resource
ISSN:
0034-6748
,
1089-7623
Language:
English
Publisher:
AIP Publishing
Publication Date:
1972
detail.hit.zdb_id:
209865-9
detail.hit.zdb_id:
1472905-2
SSG:
11
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