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  • 1
    Online Resource
    Online Resource
    SIMULTANEOUS MEASUREMENT OF THE CONSTITUENT AND THICKNESS OF THIN FILM BY X-RAY EDS
    Acta Physica Sinica, Chinese Physical Society and Institute of Physics, Chinese Academy of Sciences ; 1982
    In:  Acta Physica Sinica Vol. 31, No. 1 ( 1982), p. 30-
    Details
    In: Acta Physica Sinica, Acta Physica Sinica, Chinese Physical Society and Institute of Physics, Chinese Academy of Sciences, Vol. 31, No. 1 ( 1982), p. 30-
    Abstract: A new method which can simultaneously determine the constituent and thickness of the alloy films using the X-ray EDS has been developed. The constituent is determined by the ratios of the kα intensties of elements in the film. The thickness of the film deposited on a NaCl substrate is measured by the attenuation of the ratios of Na kα intensity/Cl kα intensity. It is not necessary to use bulk standards of pure elements. This method has been applied to Cu-Si alloy films of different thickness deposited on NaCl substrate. Under various experimental conditions, the constituent and thickness data are determined satisfactorily.
    Type of Medium: Online Resource
    ISSN: 1000-3290 , 1000-3290
    URL: Journal
    URL: Article
    DOI: 10.7498/aps
    DOI: 10.7498/aps.31.30
    Language: Unknown
    Publisher: Acta Physica Sinica, Chinese Physical Society and Institute of Physics, Chinese Academy of Sciences
    Publication Date: 1982
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    Online Resource
  • 2
    Online Resource
    Online Resource
    THE QUANTITATIVE EDS ANALYSIS OF THE CONSTITUENTS OF BINARY ALLOYS WITHOUT STANDARD SAMPLES
    Acta Physica Sinica, Chinese Physical Society and Institute of Physics, Chinese Academy of Sciences ; 1980
    In:  Acta Physica Sinica Vol. 29, No. 4 ( 1980), p. 485-
    Details
    In: Acta Physica Sinica, Acta Physica Sinica, Chinese Physical Society and Institute of Physics, Chinese Academy of Sciences, Vol. 29, No. 4 ( 1980), p. 485-
    Abstract: In general, the quantitative electron probe microanalysis is based on comparisons with standard samples. In this article, a method of the quantitative analysis of binary alloys without reference to standard samples is introduced. After simultaneous measurements of the ratios of the Ka photons of two elements in the binary alloys (Cu-Ga, GaAs) in SEM-EDS equipment, the constituents of the binary alloys are calculated from a simplified formula for the energy loss of the incident electrons, the X-ray excitation cross-section and the secondary fluorescence. When the overvol-tage of the incident electrons is kept in the range 2-3, the calculated results show good agreement with the actual constituents. The "instrument sensitivity" of the characteristic X-ray of the pure elements determined in the literature is calculated and discussed by using this simplified model.
    Type of Medium: Online Resource
    ISSN: 1000-3290 , 1000-3290
    URL: Journal
    URL: Article
    DOI: 10.7498/aps
    DOI: 10.7498/aps.29.485
    Language: Unknown
    Publisher: Acta Physica Sinica, Chinese Physical Society and Institute of Physics, Chinese Academy of Sciences
    Publication Date: 1980
    Location Call Number Limitation Availability
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    Online Resource
  • 3
    Online Resource
    Online Resource
    THE MECHANISM OF THE GRAIN GROWTH OF SUPERCONDUCTING COMPOUND Nb3Sn
    Acta Physica Sinica, Chinese Physical Society and Institute of Physics, Chinese Academy of Sciences ; 1981
    In:  Acta Physica Sinica Vol. 30, No. 3 ( 1981), p. 428-
    Details
    In: Acta Physica Sinica, Acta Physica Sinica, Chinese Physical Society and Institute of Physics, Chinese Academy of Sciences, Vol. 30, No. 3 ( 1981), p. 428-
    Abstract: Grain growth of the Nb3Sn at the Nb/solid Cu-Sn and Nb/liquid Cu-Sn interface has been investigated. Experiments have revealed that the grain growth of the Nb3Sn at the solid/solid interface still conforms to the ordinary law of the grain growth in metals, though the Nb3Sn grain size (～0.1 μm) is much smaller than that of the metals. The Nb3Sn layer growth at the solid/liquid interface is divided into two layers: (1) near the Nb, the grains are fine and closely packed, (2) near the liquid Cu-Sn, the grains are coarse and dispersive. The coarse grains, are thought to be formed by a solution/deposition process. Most of the Nb3Sn crystals have the appearance of rhombic dodecahedron and orthogonal parallelepiped. It is evident that the interfacial energy of the {110} and {100} planes of the Nb3Sn crystal is lower than the others.
    Type of Medium: Online Resource
    ISSN: 1000-3290 , 1000-3290
    URL: Journal
    URL: Article
    DOI: 10.7498/aps
    DOI: 10.7498/aps.30.428
    Language: Unknown
    Publisher: Acta Physica Sinica, Chinese Physical Society and Institute of Physics, Chinese Academy of Sciences
    Publication Date: 1981
    Location Call Number Limitation Availability
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    Online Resource
  • 4
    Online Resource
    Online Resource
    A HVEM OBSERVATION OF THE Nb/Nb〈sub〉3〈/sub〉Sn COMPOSITE SUPERCONDUCTING MATERIALS
    Acta Physica Sinica, Chinese Physical Society and Institute of Physics, Chinese Academy of Sciences ; 1980
    In:  Acta Physica Sinica Vol. 29, No. 9 ( 1980), p. 1226-
    Details
    In: Acta Physica Sinica, Acta Physica Sinica, Chinese Physical Society and Institute of Physics, Chinese Academy of Sciences, Vol. 29, No. 9 ( 1980), p. 1226-
    Abstract: The microstructure of the single core and multifilamentary Nb/Nb3Sn composite materials has been observed using a 1000 kV HVEM. Two types of moire patterns, formed by overlapping Nb3Sn/Nb3Sn and Nb/Nb3Sn crystals respectively, have been found.
    Type of Medium: Online Resource
    ISSN: 1000-3290 , 1000-3290
    URL: Journal
    URL: Article
    DOI: 10.7498/aps
    DOI: 10.7498/aps.29.1226
    Language: Unknown
    Publisher: Acta Physica Sinica, Chinese Physical Society and Institute of Physics, Chinese Academy of Sciences
    Publication Date: 1980
    Location Call Number Limitation Availability
    BibTip Others were also interested in ...
    Online Resource
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