In:
Applied Physics Letters, AIP Publishing, Vol. 41, No. 1 ( 1982-07-01), p. 44-45
Abstract:
A picosecond photoelectron pulse generated by a streak camera has been used to probe a thin film of aluminum producing a diffraction pattern representative of its lattice structure. Because this photoelectron pulse is in picosecond synchronism with the optical pulse, this technique will make possible the investigation of structural phase transitions in the picosecond time domain.
Type of Medium:
Online Resource
ISSN:
0003-6951
,
1077-3118
Language:
English
Publisher:
AIP Publishing
Publication Date:
1982
detail.hit.zdb_id:
211245-0
detail.hit.zdb_id:
1469436-0
Permalink