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  • Polymer and Materials Science  (2)
  • 1985-1989  (2)
  • 1
    Electronic Resource
    Electronic Resource
    On the use of the quartz crystal microbalance for surface analysis in combination with surface sensitive spectroscopies (1986)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 9 (1986), S. 119-123 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The quartz crystal microbalance (QCM) has a wide range of applications in surface physics and surface chemistry. We present result obtained by combining the high areal density sensitivety of the QCM with surface sensitive spectroscopies like Auger electron spectroscopy (AES) and ion surface scattering (ISS). One type of experiments deals with measurements of sputtering yield variations during ion profiling of metal-metal interfaces, situated at the surface of the QCM, as a function of varying surface composition. A new method for online measurements of angular distributions of sputtered particles from a solid surface, by utilizing the QCM's as collectors of the ejected particles, is the subject of the other type of experiment.
    Additional Material: 7 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740090207
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Angular resolved sputtering yields of noble metals and an Au-Ag alloy (1989)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 14 (1989), S. 469-476 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Sputtering of noble metals and an Au-Ag alloy with low keV ion bombardment is investigated by means of measuring angular distribution of sputter-deposited material and by analysing the bombarded target with low energy. Auger electron spectroscopy (LEAES). The measurement provides information on the angular-resolved sputtering yields and the compositional variation of the bombarded surface. The angular distributions of the sputtered particles vary with the measurement conditions: the energy and the type of bombarding ions, the crystallity of the bombarded surface and the vacuum conditions during sputtering. The measurement gives evidence of ion bombardment induced surface segregation on sputtering of the Au-Ag alloy.
    Additional Material: 7 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740140808
    Location Call Number Limitation Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
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