In:
Applied Physics Letters, AIP Publishing, Vol. 65, No. 13 ( 1994-09-26), p. 1720-1722
Abstract:
The structure near the interface of thin YBa2Cu3Ox films ( & lt;500 Å) deposited on SrTiO3(001) with laser ablation was revealed utilizing grazing incidence x-ray diffraction. The structure consists of a layer with large crystal mosaicity just above the interface, a c-oriented tetragonal layer with lattice constants a=b=3.883±0.001 Å, and a well textured but strained orthorhombic layer with lattice constants a≂3.887 Å, b≂3.867 Å in the middle, and a thin air-contaminated top layer. The thicknesses of the differently structured layers determined from x-ray reflectivity data are 50±4.7, 20±2.2, 200±5.5, and 12.56±0.14 Å, from the interface to the top layer, respectively. Since there are no additional phases appearing in this system aside from those mentioned, we conclude that the film remains strained at a distance about 300 Å above the interface.
Type of Medium:
Online Resource
ISSN:
0003-6951
,
1077-3118
Language:
English
Publisher:
AIP Publishing
Publication Date:
1994
detail.hit.zdb_id:
211245-0
detail.hit.zdb_id:
1469436-0
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