In:
Journal of Circuits, Systems and Computers, World Scientific Pub Co Pte Ltd, Vol. 01, No. 02 ( 1991-06), p. 229-238
Abstract:
This paper proposes a new procedure for testing semiconductor random access memories (RAMs). The test procedure detects simultaneously present functional faults such as stuck-at faults, transition faults and coupling faults and requires 19N operations, which is an improvement over conventional procedures. Thus testing time is reduced by the smaller number of operations of the test procedure, test generation and applications are simplified by the linear address marching.
Type of Medium:
Online Resource
ISSN:
0218-1266
,
1793-6454
DOI:
10.1142/S0218126691000069
Language:
English
Publisher:
World Scientific Pub Co Pte Ltd
Publication Date:
1991
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