GLORIA

GEOMAR Library Ocean Research Information Access

X
feed icon rss

Your email was sent successfully. Check your inbox.

An error occurred while sending the email. Please try again.

Proceed reservation?

Export
Filter
  • Wiley-Blackwell  (2)
  • 1990-1994  (2)
Document type
Keywords
Publisher
Years
Year
  • 1
    Electronic Resource
    Electronic Resource
    Submicrometer phase chemical composition analysis with an electron probe microanalyzer (1994)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 23 (1994), S. 203-207 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Submicrometer phase quantitative analysis is always a challenging problem for electron beam microanalysis because the phase is smaller than the electron beam and the specimen interaction volume. In order to obtain more accurate composition information, other analytical techniques need to be used to clarify the elements present and characterize the valence state of major elements in that submicrometer phase In this study, the electron probe microanalyzer (EPMA) was used to determine the contamination phase in the tungsten carbide-cobalt ceramic system. The average size of the contamination phase was approximately 0.5 μm in diameter. The chemical composition of the contamination phase was elucidated by combining results from x-ray mapping, valence state determination and EPMA quantitative analysis data. The effect of the contamination phase in the tungsten carbide-cobalt ceramic system is also discussed.
    Additional Material: 4 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300230504
    Location Call Number Limitation Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 2
    Electronic Resource
    Electronic Resource
    Determination of the copper oxidation state in a zeolite catalyst through the X-ray absorption edge/self-absorption effect by electron probe microanalysis (1994)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 23 (1994), S. 272-277 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Owing to improvements in impregnation techniques, the impregnation of copper compounds into a zeolite framework to form copper zeolite catalysts results in more uniformly distributed and finer (nanoscale size) copper-containing particles. In order to determine the oxidation state of copper in a copper zeolite catalyst, a method utilizing the X-ray absorption-induced (absorption edge/self-absorption) effect was developed using electron probe microanalysis. This method can provide oxidation state information that is not possible with traditional quantitative microanalysis owing to the electron beam and specimen interaction volume. The advantages and limitations of this method are discussed.
    Additional Material: 4 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300230608
    Location Call Number Limitation Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
Close ⊗
This website uses cookies and the analysis tool Matomo. More information can be found here...