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  • American Vacuum Society  (4)
  • 1990-1994  (4)
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  • American Vacuum Society  (4)
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  • 1990-1994  (4)
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Subjects(RVK)
  • 1
    Online Resource
    Online Resource
    American Vacuum Society ; 1991
    In:  Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena Vol. 9, No. 2 ( 1991-03-01), p. 794-797
    In: Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena, American Vacuum Society, Vol. 9, No. 2 ( 1991-03-01), p. 794-797
    Abstract: A compact scanning force microscope with a force sensor based on the light beam deflection method was used to study palladium clusters on mica. The force microscope was equipped to measure topography of the sample surface and the friction force between the sample and the tip. The evaporation of palladium on mica was done under UHV conditions, which were closely monitored to control both the morphology and the size of the clusters. The resulting clusters were characterized by transmission electron microscopy. The samples were then transferred in air and imaged with the scanning force microscope under ambient conditions. The diameter to height ratio near 10 and the truncated triagonal shapes of the palladium clusters agree well with the results obtained by transmission electron microscopy and with the results of a scanning tunneling microscopy study of palladium clusters on graphite. Friction images show, that the interaction between the tip and the clusters does charge them.
    Type of Medium: Online Resource
    ISSN: 1071-1023 , 1520-8567
    RVK:
    Language: English
    Publisher: American Vacuum Society
    Publication Date: 1991
    detail.hit.zdb_id: 3117331-7
    detail.hit.zdb_id: 3117333-0
    detail.hit.zdb_id: 1475429-0
    Location Call Number Limitation Availability
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  • 2
    Online Resource
    Online Resource
    American Vacuum Society ; 1994
    In:  Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena Vol. 12, No. 3 ( 1994-05-01), p. 1521-1525
    In: Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena, American Vacuum Society, Vol. 12, No. 3 ( 1994-05-01), p. 1521-1525
    Abstract: Scanning tunneling microscopy (STM) observations made on pBR322 DNA are compared with methods known to give information on DNA intrinsic curvature: polyacrylamide gel retardation, electron microscopy and computer modeling. It is concluded that STM is a powerful method for studying DNA structural features. Moreover, it is the only method to reveal simultaneously nanometric scale detail and long-range information. Use of STM for analyzing fine DNA structural features in regions involved in gene regulation should make an important contribution to genetics.  
    Type of Medium: Online Resource
    ISSN: 1071-1023 , 1520-8567
    RVK:
    Language: English
    Publisher: American Vacuum Society
    Publication Date: 1994
    detail.hit.zdb_id: 3117331-7
    detail.hit.zdb_id: 3117333-0
    detail.hit.zdb_id: 1475429-0
    Location Call Number Limitation Availability
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  • 3
    Online Resource
    Online Resource
    American Vacuum Society ; 1990
    In:  Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films Vol. 8, No. 1 ( 1990-01-01), p. 311-313
    In: Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, American Vacuum Society, Vol. 8, No. 1 ( 1990-01-01), p. 311-313
    Abstract: Scanning tunneling microscopy (STM) has been used to image gold and palladium clusters deposited under ultrahigh vacuum (UHV) conditions on clean cleaved surfaces of natural graphite single crystals. Extensive transmission electron microscopy (TEM) studies were performed to determine the growth conditions. Moreover each sample was checked by ex situ TEM after each in situ STM study. The overall shape of the largest isolated clusters imaged by STM (100–200 Å) is consistent with TEM observations: triangular or hexagonal outlines and clusters sitting along surface steps are elongated by coalescence. STM also reveals that they have a height versus diameter ratio about 0.1. Smallest clusters (10–20 Å) are imaged with atomic resolution simultaneously with the graphite lattice. They are close packed and 2–3 atomic layers high. On occasion, two-dimensional Pd islands are observed. They have an hexagonal non-close-packed arrangement.
    Type of Medium: Online Resource
    ISSN: 0734-2101 , 1520-8559
    RVK:
    Language: English
    Publisher: American Vacuum Society
    Publication Date: 1990
    detail.hit.zdb_id: 1475424-1
    detail.hit.zdb_id: 797704-9
    Location Call Number Limitation Availability
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  • 4
    Online Resource
    Online Resource
    American Vacuum Society ; 1991
    In:  Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena Vol. 9, No. 2 ( 1991-03-01), p. 804-805
    In: Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena, American Vacuum Society, Vol. 9, No. 2 ( 1991-03-01), p. 804-805
    Abstract: Comparison between UHV and air observations on Pd clusters deposited under UHV on a clean graphite surface is made. For the largest clusters ( & gt;10 nm), no dramatic influence of air exposure is observed. Quite surprisingly, we have been able to image in air the surface atomic arrangement of 1.5 nm Pd clusters. They have a tetrahedron shape with (111) facets and are epitaxially oriented: Pd (111)//graphite (00.1), Pd[112̄]//graphite [01.0] .
    Type of Medium: Online Resource
    ISSN: 1071-1023 , 1520-8567
    RVK:
    Language: English
    Publisher: American Vacuum Society
    Publication Date: 1991
    detail.hit.zdb_id: 3117331-7
    detail.hit.zdb_id: 3117333-0
    detail.hit.zdb_id: 1475429-0
    Location Call Number Limitation Availability
    BibTip Others were also interested in ...
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