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  • American Institute of Physics (AIP)  (2)
  • National Academy of Sciences
  • 1990-1994  (2)
Document type
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Year
  • 1
    Electronic Resource
    Electronic Resource
    X-ray detection characteristics of microchannel plates using synchrotron radiation in the energy range from 0.06 to 0.6 keV (1990)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 61 (1990), S. 2566-2570 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The characteristics of microchannel plates (MCPs) for x-ray detection have been investigated with continuous x-ray energy variation using synchrotron radiation in the XUV and soft x-ray region (from 60 to 600 eV). The current response data have shown x-ray absorption fine structure (EXAFS or XANES) near the oxygen K absorption edge as well as a jump structure near the silicon L edge; these structures are explained by the surface composition of channel walls (SiO2). The data show that the surface layer of a microchannel is essential for x-ray detection by MCPs in this energy range. The precise current response curve has been completed for the wide x-ray energy range from 0.06 to 82 keV combined with the previously reported data [Kondoh et al., Rev. Sci. Instrum. 59, 252 (1988); Cho et al., ibid. 59, 2453 (1988); Yamaguchi et al., ibid. 60, 368, 2307 (1989)].
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1141917
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Study of Y1Ba2Cu3O7−δ film growth on (200) oriented yttria stabilized zirconia buffer layer on metallic substrates (1994)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 65 (1994), S. 109-111 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: This work presents the first report on the growth mechanism of 123 films on metallic substrates with (200) oriented and partially a-b plane oriented polycrystalline yttria stabilized zirconia (YSZ) buffer layer, with and without a metallic underlayer coating used between the substrate and the buffer layer. The microstructure and grain morphology of 9- and 160-nm-thick films of Y1Ba2Cu3O7−δ (YBCO) were studied by scanning electron microscopy, scanning tunneling microscopy, and x-ray diffraction. Our studies reveal that YBCO films on c-axis oriented and partial a-b plane oriented YSZ buffer layers on metallic substrates, initially grow two dimensionally, with the elongated grains of ∼100 nm length, mostly aligned along the 〈200〉 axis of the YSZ, owing to the strong atom-substrate bonding. The thicker films, however, show three-dimensional terraced island growth with several turns of the screws, with the screw edges still along the 〈200〉 axis of YSZ. These terraced islands seem to coalesce in the film with the highest Jc value, ∼1×105 A/cm2.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.113049
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    Paper (German National Licenses)
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