Digitale Medien
[S.l.]
:
American Institute of Physics (AIP)
Journal of Applied Physics
73 (1993), S. 4324-4331
ISSN:
1089-7550
Quelle:
AIP Digital Archive
Thema:
Physik
Notizen:
A computer simulation study of a two-dimensional two-component resistor network model is presented. The model is constructed to elucidate the relationship between interfacial dynamics and formation of porous structures. The interfacial dynamics, which are stochastic in nature, have been studied and the effect of both global and regional characteristics in interfacial dynamics on the resulting morphologies has been investigated. In the simulation, the advancing interface exhibits either an unstable front as dictated by the Mullins–Sekerka instability, or a stable one that is roughened by kinetic noise. The relevance of the simulation to the experimental observations of porous silicon formation is demonstrated and the implications are discussed.
Materialart:
Digitale Medien
URL:
http://dx.doi.org/10.1063/1.352816
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