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  • 1995-1999  (3)
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  • 1
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 102 (1995), S. 5077-5081 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: The irreversible random adsorption of particles on a surface is guided by the available surface function φ. The relative fluctuation σ2/〈n〉 in the number of particles n in a finite region provides one characterization of the distribution of these particles on the surface. We show rigorously that the two quantities are given by the same expression to first order in the surface coverage, for any irreversible adsorption process. This is confirmed in two particular cases: for random sequential adsorption, where values for σ2/〈n〉 from numerical simulations can be compared to an analytic expression for φ, and for Ballistic deposition, where experimental values for deposition under a strong gravitational influence can also be compared to an existing analytical expression for φ. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    The @journal of physical chemistry 〈Washington, DC〉 99 (1995), S. 13291-13300 
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Physics
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 105 (1996), S. 1646-1653 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: We investigated the suitability of reflectometry as a sizing method for polystyrene latex particles. This technique, where the particles are adsorbed at a quartz/water interface, involves the analysis of the reflection around the Brewster angle of light polarized in the plane of incidence. A computation of a full reflectivity curve containing about 20 datapoints, taking into account all electromagnetic interactions, is extremely complex and may take up to 100 h on an Indy R4600 computer (Silicon Graphics, Mountain View, CA). To use the complete electromagnetic theory for analysis of experiments therefore is impractical. We analyzed the experimental reflectivity curves using an approximate theory (free-sphere model), which neglects all electromagnetic interactions between different particles and their images in the substrate. To assess the errors introduced by neglecting these interactions, we have calculated reflectivity curves using the full electromagnetic theory for this system, and analyzed them with the free-sphere model. We found that the diameters determined with the free-sphere model deviate at most 2% from the actual values. The surface coverage determined with the free-sphere model is systematically smaller than the actual coverage. The difference can be as large as 15% at a coverage of 9%. We also show that size polydispersity of the sample plays a minor role in the analysis of the data. We illustrate the usefulness of the free-sphere model, by analyzing measurements in which polystyrene latex particles are swollen by an organic solvent that is miscible with water. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
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