In:
The Journal of Chemical Physics, AIP Publishing, Vol. 105, No. 13 ( 1996-10-01), p. 5510-5517
Abstract:
The electron drift mobility (μ) was measured by a time-of-flight method in pure liquid o- and m-xylene under high pressures up to 300 MPa, and in the temperature ranges from 15 to 120 °C and 0 to 100 °C, respectively. In both liquids μ increases in the lower pressure region at lower temperatures. At higher pressures μ decreases gradually with pressure at all temperatures studied. The pressure dependence of μ was interpreted in terms of a two-state model and a hopping model. When μ increases with pressure this interpretation leads to a positive volume change upon introduction of electrons into the liquid, showing electrons reside in cavities of radius 0.31 to 0.32 nm, whereas in the high pressure region electron attachment to xylene molecules occurs, accompanied by hopping of electrons between molecules.
Type of Medium:
Online Resource
ISSN:
0021-9606
,
1089-7690
Language:
English
Publisher:
AIP Publishing
Publication Date:
1996
detail.hit.zdb_id:
3113-6
detail.hit.zdb_id:
1473050-9
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