In:
Journal of Synchrotron Radiation, International Union of Crystallography (IUCr), Vol. 5, No. 3 ( 1998-05-01), p. 239-245
Abstract:
Using X-ray diffractometry and spectral measurements, the structure and properties of graded X-ray optical elements have been examined. Experimental and theoretical data on X-ray supermirrors, which were prepared by the magnetron sputtering technique using precise thickness control, are reported. Measurements on graded aperiodic Si 1− x Ge x single crystals, which were grown by the Czochralski technique, are also presented. The lattice parameter of such a crystal changes almost linearly with increasing Ge concentration. The measurements indicate that Si 1− x Ge x crystals with concentrations up to 7 at.% Ge can be grown with a quality comparable to that of pure Si crystals.
Type of Medium:
Online Resource
ISSN:
0909-0495
DOI:
10.1107/S0909049597019043
Language:
Unknown
Publisher:
International Union of Crystallography (IUCr)
Publication Date:
1998
detail.hit.zdb_id:
2021413-3
SSG:
13
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