In:
Applied Physics Letters, AIP Publishing, Vol. 75, No. 17 ( 1999-10-25), p. 2542-2544
Abstract:
Perovskite barium strontium titanate Ba0.5Sr0.5TiO3(BST) thin films were grown on (001) LaAlO3 (LAO) using pulsed-laser ablation. The microstructures of the as-grown BST films were studied with selected electron diffraction, transmission electron microscopy, and scanning transmission electron microscopy. The BST thin films are oriented with their [001] directions parallel to the 〈102〉 directions of the LAO. Both cross-sectional and plan-view studies show the BST films to be single crystals with smooth surfaces. The interfaces were seen to be atomically sharp by cross-sectional, high-resolution electron microscopy. The density of misfit dislocations was consistent with the 4.3% lattice mismatch, and they were found to be dissociated into partials.
Type of Medium:
Online Resource
ISSN:
0003-6951
,
1077-3118
Language:
English
Publisher:
AIP Publishing
Publication Date:
1999
detail.hit.zdb_id:
211245-0
detail.hit.zdb_id:
1469436-0
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