In:
Applied Physics Letters, AIP Publishing, Vol. 69, No. 1 ( 1996-07-01), p. 43-45
Abstract:
A diagnostic test based on the parallelism of neighboring trajectories generated from a time series in phase space for visible determinism is applied to characterizing complexities in growth striations of Czochralski silicon crystals. Change in the structure of the striations by crystal annealing is examined in terms of degrees of randomness in growth striations.
Type of Medium:
Online Resource
ISSN:
0003-6951
,
1077-3118
Language:
English
Publisher:
AIP Publishing
Publication Date:
1996
detail.hit.zdb_id:
211245-0
detail.hit.zdb_id:
1469436-0
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