In:
Modern Physics Letters B, World Scientific Pub Co Pte Ltd, Vol. 13, No. 19 ( 1999-08-20), p. 663-669
Kurzfassung:
To solve the problem on the microstructural characterization of metallic superlattices, taking the NiFe/Cu superlattices as example, we show that the structures of metallic superlattices can be characterized exactly by combining low-angle X-ray diffraction with high-angle X-ray diffraction. First, we determine exactly the total film thickness by a straightforward and precise method based on a modified Bragg law from the subsidiary maxima around the low-angle X-ray diffraction peak. Then, by combining with the simulation of high-angle X-ray diffraction, we obtain the structural parameters such as the superlattice period, the sublayer and buffer thickness. This characterization procedure is also applicable to other types of metallic superlattices.
Materialart:
Online-Ressource
ISSN:
0217-9849
,
1793-6640
DOI:
10.1142/S021798499900083X
Sprache:
Englisch
Verlag:
World Scientific Pub Co Pte Ltd
Publikationsdatum:
1999
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