In:
Acta Physica Sinica, Acta Physica Sinica, Chinese Physical Society and Institute of Physics, Chinese Academy of Sciences, Vol. 52, No. 4 ( 2003), p. 809-
Abstract:
The reflectivity of the 28.5nm Mo/Si multilayer mirrors are measured at Xingguang-Ⅱ laser facility using a flat-field grating spectrograph with the Ne-like Cr x-ray laser as a soft x-ray source. The reflectivities obtained for two samples are 0031 and 0096.
Type of Medium:
Online Resource
ISSN:
1000-3290
,
1000-3290
Language:
Unknown
Publisher:
Acta Physica Sinica, Chinese Physical Society and Institute of Physics, Chinese Academy of Sciences
Publication Date:
2003
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